Transcript Slide 1

4. EMC measurement methods
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EMC measurement methods
Why EMC standard measurement methods
 Check EMC compliance of ICs, equipments and systems
 Comparison of EMC performances between different products, different
technologies, designs, PCB routings
 Improve interaction between customers and providers (same protocols, same
set-up)
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Emission measurement methods
Emission – General measurement set-up
Control Acquisition
Radiated or
conducted coupling
Acquisition system
50Ω adapted
path
Device under test
Coupling device
 Coupling network
 Antennas
 Wave guide
 Spectrum
analyzer
 EMI receiver
 Oscilloscope
Emission requirements verified ?
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Emission measurement methods
International standards for IC emission measurement methods
IEC 61967-2
(TEM : 1GHz)
IEC 61967-3/6
(Near field scan, 5GHz)
IEC 61967-4
(1/150 ohm, 1 GHz)
IEC 61967-5
(WBFC, 1 GHz)
IEC 61967-7
(Mode Stirred Chamber: 18 GHz)
IEC 61967-2
(GTEM 18 GHz)
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Emission measurement methods
GTEM cell : radiated emission up to 18 GHz
foam
absorber
50 Ohms
resistive load
septum
Emission
spectrum
test
board
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Emission measurement methods
IEC 61967-4 International Standard : 1/150 Ohm method
IC
1ohm
Spectrum
Analyser
Complex
implementation
with multiple
power pins
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Emission measurement methods
IEC 61967-3 International Standard : Near field scan
Y axis
Microcontroller - 32 MHz scan
High
dBµV
X axis
Low
freq
32MHz
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Emission measurement methods
IEC 61967-3 International Standard : Silicon scan
E
C
T
P
W
M
MSCAN
EE
1K
A
T
D
1
A
T
D
0
Power rails
Hx Probe
28K
FEEPROM
32K FEEPROM
Priviledged
current
measurement
MI
BUS
MSI
Power rails
RAM
2K
K
IN
W BDM
T
U
MMI
LIM D60
CPU 12
W
BKP MEBI C CGM
R
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Immunity measurement methods
Immunity – General measurement set-up
Injected level
Extraction
Disturbance generation
50Ω adapted
path
Failure detection
Radiated or
conducted coupling
 Harmonic signal
Coupling device
 Coupling network
 Transients
 Antennas
 Burst
 Wave guide
Immunity requirements verified ?
Device under test
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Immunity measurement methods
International standards for IC susceptibility measurement methods
IEC 62132-2
(Bulk Current Injection : 1 GHz)
IEC 62132-3
(Direct Power Inj 1GHz)
IEC 62132-4
(TEM/GTEM)
IEC 62132-5
(WBFC 1 GHz)
New proposal:
(LIHA : 10 GHz)
Still research:
(NFS 10 GHz)
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Immunity measurement methods
IEC 62132-3 International Standard : Direct Power Injection
Signal generator
Oscilloscope
Device under test
Coupling
Capacitance
IEEE Bus
10W Amplifier
DUT
Dout
Printed Circuit Board
Good signal
or
Failure signal
Power increase loop until failure
PC Monitoring
Frequency loop 1 MHz – 3 GHz
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Immunity measurement methods
IEC 62132-2 International Standard : Bulk Current Injection
Parasitic current
CAN Bus
Fault
DUT
Normal
current
RF
power
Measured
current
Microcontroler
 Inductive coupling to the network
 Parasitic current injected on the chip
 Limited to 1 GHz
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EMC equipments
Vector Network Analyzer 10
GHz (100 K€)
Amplifier 3 GHz 100W
(60 K€)
Signal Synthesizer 6 GHz
(20 K€)
 Expensive ….
 Complete EMC laboratory : 500 K€
Spectrum analyzer 40 GHz
(40 K€)
GTEM cell 18 GHz
(15 K€)
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5. EMC models
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Models – What for ?
IC designers want to predict EMC prior fabrication
Noise margin
Voltage bounce on Vdd
 IC designers want to predict power integrity and EMI during design cycle to
avoid redesign
 EMC models and prediction tools have to be integrated to their design flows
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Models – What for ?
Equipment designers want to predict EMC before fabrication
© Siemens Automotive Toulouse
 Most of the time, EMC measurements are performed once the equipment is built.
 No improvements can be done at conception phase.
 Predict EMC performances  IC, board, equipment optimizations
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EMC of IC models
EMC Models depends on the targeted complexity and the confidentiality.
Level
0 V(f), 100 Z(f)
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Equipment
V, Z
Board
101 dipoles
Dipoles
Component
ICEM
101 R,L,C,I
LEECS
Physical
102 R,L,C,I
Expo
low
medium
104 R,L,C,I
PowerSI
high
spice
x-high
106 R,L,C,I
Complexity
Confidentiality
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