Transcript The EMC certification

EMC measurements of
electronic components
Summary
1.
Context - EMC certification
2.
Illustration of electromagnetic emission produced
by electronic devices
3.
Illustration of susceptibility to electromagnetic
disturbances of electronic devices
4.
Some EMC measurement tests
5.
Conclusion
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March 17
Context - The EMC certification
European Directives for electronic products
RTT&E 1999/5/CE : for radio equipments and telecommunication
terminals
CEM 2004/108/CE : electromagnetic compatibility of electronic products
BT 2006/95/CE : electric safety for electronic products (0 to 1000 volt AC
and 1500 DC)
RoHS 2011/65/UE : limitation of six hazardous substances (e.g. lead)
DEEE 2002/96/CE : management of electric and electronic equipment
waste
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March 17
Context - The EMC certification
EMC European Directive
 The European directive 89/336/EEC (1996) and then 2004/108/EC (2004)
requires that all « electrical apparatus » placed on the European market :
 Do not produce electromagnetic interferences able to disturb radio or
telecom equipments , and the normal operation of all equipments
 Have a sufficient immunity level to electromagnetic interferences to prevent
any degradation of the normal operation.
 All manufacturers of « electrical apparatus » must
certify that the directive is supposed respected by
delivering a declaration of conformity and placing a
CE mark on the product.
CE mark
 Using harmonized standards adapted to the product to verify the
supposition of conformity is recommended
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March 17
Context - The EMC certification
R&TTE European Directive
 The European directive 99/5/EC (1999) Radio & Telecommunications Terminal
Equipment which is applied to all telecom and radio equipments emitting on the
band 9 KHz – 3000 GHz replace the EMC directive. .
 R&TTE requires that telecom and radio equipments placed on the European
market: :
 Comply to safety constraints given by the Low Voltage directive
(73/23/EEC) (e.g. the limit of EM exposure for persons) and the EMC
constraints given by the EMC directive 2004/108/EC.
 Radio equipments use spectral resources dedicated for terrestrial and
spatial communications without generating any interferences.
 R&TTE mark:
Warning signal for class
2 equipments (special
recommandations)
Required for all
equipments under the
R&TTE directive
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March 17
Context - The EMC certification
Outside European Union ?
• United States Federal Communications Commission (FCC)
• Canada: Industrie Canada (IC)
• Japan : Voluntary Control Council for Interference by Information Technology
Equipment (VCCI)
• China : China Compulsory Product Certification (CCC)
• Australia – New-Zeland : Australian Communications Authority (ACA)
• Taïwan : Bureau of Standards, Metrology and Inspection (BSMI) and National
Communications Commission (NCC)
• Russia : GOST (State Committee for Quality Control and Standardization ...
Regulatory approchs of EMC in every countries.
Non harmonized regulation between countries, except if Mutual Recognition
Agreements (MRA) exists.
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March 17
Context - The EMC certification
Role of EMC standards
 Define terms, units, general conditions
 Define measurement methods (equipments,
configuration, set-up)
 Propose calibration procedures
 Give suggested/mandatory limits
 Guidelines for test reports
 Appropriate for all products ? For all environments ? For all
operating configurations ?
 Do standards change with time ?
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March 17
Context - The EMC certification
EMC normative bodies
International
European
International Electrotechnical
Commission(IEC)
TC77
IEC 61000-X
European Commitee for
Electrotechnical
Standardization
European
Telecommunication
Standards Institute
(CENELEC)
(ETSI)
Comité International Spécial des
Perturbations
Radioélectriques(CISPR)
Harmonized standards
EN 50XXX
EN 55XXX
EN 6XXXX
CISPR-XX
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EN 300XX
Context - The EMC certification
Commercial harmonized standard (non exhaustive list !)
Basic standard
(general and
fundamental rules)
Generic standard
(for equipments in a
specific environment)
Product
standard
(for a specific product
family)
EN 61000-4-x
(IEC61000-4-x)
EMC – Testing and measurement techniques
EN 61000-6-3
(IEC61000-6-3)
Generic Emission Standard, for residential, commercial and
light industrial environment
EN 61000-6-1
(IEC61000-6-1)
Generic Immunity Standard, for residential, commercial and
industrial environment
EN 55022
(CISPR22)
Information technology equipment (ITE)
EN 55014
(CISPR14)
Household appliances, electric tools and similar apparatus
EN 55012
(CISPR12)
Vehicles, boats and internal combustion engines
EN 330220
(ETSI 330 220)
EN 330330
(ETSI 300330-1)
Electromagnetic compatibility and radio spectrum matters
(ERM); Short Range Devices (SRD); Radio equipment to be
used in the 25 MHz to 1 000 MHz frequency range with power
levels ranging up to 500 mW;
Electromagnetic compatibility and radio spectrum matters
(ERM); Short Range devices (SRD); Radio equipment to be
used in the frequency range 9 KHz to 25 MHz and inductive
loop systems in the frequency range 9 KHz to 30 MHz
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March 17
Context - The EMC certification
Commercial harmonized standard (non exhaustive list !)
 Automotive, military, aerospace and railway industries have developed
their own EMC standards.
Applications
Standard references
Automotive
ISO 7637, ISO 11452, CISPR 25,
SAE J1113
Aerospace
DO-160, ED-14
Military
MIL-STD-461D, MIL-STD-462D, MILSTD-461E
Railway
EN 50121
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March 17
Context - The EMC certification
Case study 1

Are the following product subject to the EMC European directive ?
WiFi dongle (ISM band)
Server motherboard
Passive antenna passive for RFID application
Wireless audio headset
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March 17
Context - The EMC certification
Case study 2

You want to place on the European
market a notebook.

Are you under the European EMC
directive 2004/108/EC ?

If yes, which EMC standard(s)
should you follow ? What tests
should you conduct for the EMC
certification ?
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Context - The EMC certification
Case study 2

Application of EN55022 : “Information
technology equipment – Radio
disturbance characteristics – Limits and
methods of measurement” and EN55024 :
« Information technology equipment –
Immunity characteristics – Limits and
methods of measurement » :

Any equipment dedicated to processing,
storage, display, control of data and
telecommunication messages, equipped
with one or more ports, and supplied under
less than 600 V.

Except equipments or modules dedicated
only to radio emission or reception.
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March 17
Context - The EMC certification
Case study 2
 Suggested emission tests:
Conducted emission
150 KHz – 30 MHz on power
supply mains
150 KHz – 30 MHz on
telecommunication ports
Radiated emission

30 MHz – 6 GHz @ 3 or 10 m
Suggested immunity tests:
ESD
EFT / burst
Conducted immunity
Radiated immunity
Surge
Voltage dips and
interruptions
+/- 4 KV contact, +/- 8 KV air
5/50 ns, 1 KV, 5 KHz repetition
150 KHz – 80 MHz, 3 V rms
80 – 1000 MHz, 3 V/m, modulation
AM 1 KHz 80%
1 KV 1.2/50 µs pulse on power
40 % variations of the power
supply, repeated 5×
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March 17
Context - The EMC certification
Case study 3

You are a semiconductor manufacturers and you want to sell your
integrated circuits in the European market. Your ICs are dedicated to
automotive applications.

Which EMC standard(s) should you follow ? What tests should you
conduct for the EMC certification ?
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Context - The EMC certification
Case study 3

If your integrated circuits can not operate by themselves, you don’t
need EMC certification.

However, your customers will certainly push you to guarantee the low
emission and susceptibility of your devices, require measurements,
models, support….

Examples of standards providing EMC measurement for ICs:
•
IEC 61967: Integrated Circuits, Measurement of Electromagnetic
Emissions, 150 kHz to 1 GHz
•
IEC 62132: Integrated circuits - Measurement of electromagnetic immunity,
150 kHz to 1 GHz
•
ISO11452: Road vehicles - Electrical disturbances by narrowband
electromagnetic energy - Component test methods
•
ISO 7637 or IEC61000-4-2/4/5 for ESD, pulse, surge testing.
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March 17
EMC measurements of components
Illustration of electromagnetic
emission produced by
electronic devices
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March 17
Electromagnetic emission of electronic devices
Emblematic EMC equipment – Spectrum Analyser (EMI receiver)
Frequency adjustment
: Start, stop , center
Y= power (dBm, dBµV)
RBW – frequency
resolution, noise
floor reduction
50 Ohm input
X= frequency
VBW – smooth
display
Emission measurement requires high sensitivity and resolution
Emission
measurement standards often recommend spectrum
analyser adjustment
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March 17
Amplitude adjustment :
Level reference, dynamic.
Electromagnetic emission of electronic devices
Emblematic EMC equipment – Spectrum Analyser (EMI receiver)

Principle: based on super heterodyne receiver
IN
Input
signal
Output signal
OUT
IF filter
Mixer
f
Frf
Local oscillator
LO
Flo
f
OUT IF filter
A
RBW
No
Fif
Fif
cos rf t  cos lot 
Frf+Flo f
1
1
cosrf  lo t  cosrf  lo t
2
2
ωif
Detected power:
P = ½.A²+No.RBW
f
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March 17
Electromagnetic emission of electronic devices
Emblematic EMC equipment – Spectrum Analyser (EMI receiver)

Building blocks and adjustable elements:
Input Attenuation
signal Attenuator
DC blocking
RBW
Mixers
IF filter
Low
pass
filter
Gain
IF
Analog
filter
Local
oscillator
Frequency
sweep
Fstart / Fstop
Fcenter / Span
Point number
Detector
Gain
log
VBW
Video
filter
Display
Reference
oscillator
20
Envelope
detector
March 17
Electromagnetic emission of electronic devices
Emblematic EMC equipment – Spectrum Analyser (EMI receiver)

What are the main adjustments ?

What are their effects on measurement result ?
21
Electromagnetic emission of electronic devices
Emblematic EMC equipment – Spectrum Analyser (EMI receiver)
Example:
effect of RBW and VBW.
Measurement
of 100 MHz sinus.
Amplitude = 90 dBµV
Amplitude = 20 dBµV
Sweep time :
VBW = 30 KHz  100 ms
VBW = 1 KHz  980 ms
Sweep time :
RBW = 100 KHz  2.5 ms
RBW = 10 KHz  100 ms
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March 17
Electromagnetic emission of electronic devices
Emblematic EMC equipment – Spectrum Analyser (EMI receiver)
Example:
Influence of detector type (peak vs. quasi-peak vs. average).
Measurement
of radiated emission of a microcontroller.
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March 17
Electromagnetic emission of electronic devices
Case study 4 – Electromagnetic emission from a class-D amplifier

MAX9768 – 10 W mono class D speaker amplifier, EN55022 class B
compliant.

Applications: low power portable application (notebook computer,
Multimedia monitor, GPS navigation system…)
www.maxim.com
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March 17
Electromagnetic emission of electronic devices
Case study 4 – Electromagnetic emission from a class-D amplifier

Class D amplifier principle (half-bridge):
Triangle waveform
oscillator
VDD
Amplified
audio signal
PWM signal
Output filter
+
Audio source
T
Speaker
GND
GND
Audio input signal
VDD
t
PWM signal
TSW t 
out t   VDD
T
Tsw
Amplified audio signal
GND
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March 17
t
Electromagnetic emission of electronic devices
Case study 4 – Electromagnetic emission from a class-D amplifier

Measure and compare the currents circulating on wires OUT+
and OUT- of the speaker cable.

Are they perfectly symmetrical ?
GND
I+
Class D
GND
I-
GND
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March 17
8 Ω Speaker
Electromagnetic emission of electronic devices
Case study 4 – Electromagnetic emission from a class-D amplifier

Differential vs. common mode currents.

Common mode appears when the return current path is not perfectly defined.
If I1 ≠ I2
Interco 1
Differential
mode
I1
I2
Decomposition in 2
distinct propagation
modes
Id
1
Id
2
Ic
Interco 2
I1  I 2
ID 
2
I C  I1  I 2
IC
I1 
ID
2
1
Common
mode
IC
I2 
ID
2
2
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March 17
Ic
Electromagnetic emission of electronic devices
Case study 4 – Electromagnetic emission from a class-D amplifier

Differential vs. common mode radiation (at a distance r in far-field).
I1
d
I2
ED max  1.316.10
EC
L << λ
max
14
 1.257.10
L.d . f 2
ID
r
6
L. f
IC
r
L=1 m, d=2 mm, r = 3 m, IDM = 20 mA, ICM = 200 µA
Evaluate radiation produced
by the cable output of the
class-D amplifier.
Limit EN55022 class A
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March 17
Electromagnetic emission of electronic devices
Case study 4 – Electromagnetic emission from a class-D amplifier

Evaluate the differential and common-mode radiation at 3 m
produced by the speaker cable.

Does it comply with EN55022 class B standard ?
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March 17
Electromagnetic emission of electronic devices
Case study 5 – Electromagnetic emission from a microcontroller
Transient current produced by IC activity leads to conducted and radiated
emission.
Vdd Dig
IMem(t)
Icore(t)
Digital
Core
Memory
Vdd IO
Integrated
circuit
Vdd osc
Iosc(t)
Oscillator
PLL

I/O
Analog
IIO(t)
PCB
lines
IIO(t)
IA(t)
Vdd A
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March 17
Ext.
Loads
Electromagnetic emission of electronic devices
Case study 5 – Electromagnetic emission from a microcontroller

Magnetic field around a wire:
Tangential probe
Vmeas
H
Hy
Scan axis
Vertical probe
y
Vmeas
z
y
Hz
I
x

Link between the magnetic field and probe voltage:
d
V probet   0
dt
 H .dS
probesurface
Vprobe   j0
y
 H .dS
probesurface
March 17
Electromagnetic emission of electronic devices
Case study 5 – Electromagnetic emission from a microcontroller

The microcontroller Freescale MPC5604B has the following configuration:

CPU running at 40 MHz

Internal clock produced by an on-chip PLL running at 80 MHz,
synchronized by a 8 MHz quartz oscillator

13 I/O switching at 200 kHz

With a near-field probe, locate the main source of electromagnetic emission
created by the microcontroller.

Do they really contribute to far-field radiated emission?
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March 17
Electromagnetic emission of electronic devices
Case study 5 – Electromagnetic emission from a microcontroller

Pin-out of microcontroller Freescale MPC5604B:
VDDHV/VSSHV
(I/O supply)
VDDHV_ADC/VSSHV_ADC
(ADC supply)
5 I/O switching at
200 kHz
VDDLV/VSSLV (Core
+ PLL supply)
8 I/O switching at
200 kHz
External
quartz
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March 17
Electromagnetic emission of electronic devices
Case study 5 – Electromagnetic emission from a microcontroller

r
Near-field vs. far-field emission
Far-field region
 Plane wave
 |E/H| = 377 Ω
 E and H  1/r
Radiated nearfield region
Reactive near-field region
Components
Printed circuit board
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March 17
 Strong localized E and H field
 Complex relation between E and H
 E and H  1/r3 or 1/r²
Electromagnetic emission of electronic devices
Case study 6 – Radiated emission from a digital line

Simple radiated emission model for a PCB microstrip line:
P
Htan
Magnetic-field emission in near-field
R
H tan 
I
t
h
H tan 
Ground plane
h
Image current
I
2R

I
2 R  t  2h 
hI
, t  h, t  R, h and R  
RR  2h 
I
Worst-case electromagnetic emission in far-field:
20

2
E

hLf
I , L  
 max
c0 r

 Emax  2  0 hfI , otherwise

r
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March 17
Electromagnetic emission of electronic devices
Case study 6 – Radiated emission from a digital line

Consider the following PCB digital line between two CMOS inverters:
Magnetic-field probe
(Loop radius = 2 mm)
Inverter AHCT04
Inverter AHCT04
Microstrip line (w = 1 mm, h = 1.6 mm, L = 10 cm)
10 MHz

At three different frequency between 10 and 1000 MHz, estimate the current
which circulated along the microstrip line.

Estimate the far-field emission at 3 meter.

Does the radiated emission comply with EN55022 limit?
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March 17
EMC measurements of components
Illustration of susceptibility to
electromagnetic disturbances (RFI)
of electronic devices
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March 17
Susceptibility of electronic devices to RFI
Effect of IC malfunction due to EM disturbance

Striking of berth by Coastal Inspiration, 20th dec 2011, Nanaimo, British
Columbia, Canada.

A problem of an amplifier, due to EM disturbances, leads to a failure in speed
reduction command.
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March 17
Susceptibility of electronic devices to RFI
Case study 7 – Susceptibility of a bandgap reference voltage

LTC1798: 2.5 V micropower bandgap voltage reference
Effect on the
output voltage ?
RFI
2.7 V to 12 V
2.5 V +/- 4 mV
LTC1798
100 nF
100 nF

Couple an harmonic conducted disturbance to the input of the bandgap
reference.

Observe the effect on the output voltage, for frequencies ranging from 1 to
100 MHz.
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March 17
EMC measurements of components
Some EMC measurement tests
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March 17
Emission measurement set-up
Emission – General measurement set-up
Control Acquisition
Radiated or
conducted coupling
Acquisition system
50Ω adapted
cable
Coupling device
 Coupling network
 Antennas
Device under test
 Waveguide
Result de-embedding
Post-processing
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March 17
 Spectrum analyser
 EMI receiver
Emission measurement set-up
Typical conducted emission test for electronic/electrical products
 Frequency range = 150 kHz – 30/150 MHz
Line Impedance
Stabilized
Network(LISN)
Current clamp
Power supply
harness
EUT
Load harness
Load
Ground plane
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March 17
EMI receiver
Emission measurement set-up
Typical conducted emission test for electronic/electrical products
 Conducted emission test with Line Impedance Stabilizer Network
(LISN)
IRF1
AC mains /
AC mains
/
Battery
Battery VRF1
IRF2
VRF2
50 Ω measurement
receiver
IRF1
Phase orAC
‘+’ or
conductor
DC power supply
LISN AC orVRF1
EUT
cable
DC power
supply
EUT
cable
IRF2
Phase or ‘-’VRF2
conductor
Ground, earth
Ground, earth
43
Emission measurement set-up
Typical radiated emission test for electronic/electrical products
 Frequency range = 30 MHz/80 MHz – 1 GHz and more
EN55022
(Siepel)
Absorbents
Wide band
(calibrated) antenna
Device under test
1m
1m
EMI receiver or
spectrum analyzer)
ALSE = Faraday cage
(with absorbents: semianechoic chamber)
R = 3 ou 10 m
1m
44
Power supply,
DUT control
Emission measurement set-up
Typical radiated emission test for electronic/electrical products
If far field and free space conditions ensured:
Optional pre-amplifier
Low loss
50 Ω cable
E field
EMI receiver
Vemi
Rs =50 Ω
Voltage Vemi or
Power Pemi
Bilog antenna
(or log-periodic,
biconical, dipole…)
Vemi dBµV   E dBµV / m  AF (dB / m)  GaindB   LossdB 
Pemi dBm   Vemi dBµV   107
with RS  50
 R1 
E R2   E R1   20. log  
 R2 
The E field varies in 1/r with the distance r (the radiated
power in 1/r²)  possible extrapolation of field intensity.
45
AF = Antenna factor
(from calibration)
March 17
Emission measurement set-up
IC Conducted emission - IEC 61967-4 –1 ohm / 150 ohms method
Vdd
RF current
PCB

Conducted emission is produced
by RF current induced by IC
activity.

The current induced voltage
bounces along power distribution
network and radiated emission.
IC
IC transient
current
IC
Decoupling
IC ground
IRF
Parasitic coupling
between ground
planes
49 Ω
1Ω
VA
EMI
receiver
VA 
50
I
I RF  RF
49  50  1
2
Parasitic
inductor
Peripheral ground
The « 1 ohm » method aims at measuring the RF current
flowing from circuit Vss pin(s) to the ground reference.
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March 17
Emission measurement set-up
IC Conducted emission - IEC 61967-4 –1 ohm / 150 ohms method

dsPIC33F: measurement in time domain and frequency of the voltage
across the 1 Ω probe  proportional to the IC current.
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March 17
Emission measurement set-up
IC Conducted emission - IEC 61967-4 –1 ohm / 150 ohms method

I/O switching is a major contributor to conducted emission.

They induced voltage fluctuation along power supply and I/O lines.
Vdd
150 Ω probe
Decoupling
I/O buffer
EMI
receiver
R1 = 120 Ω C = 6.8 nF
VRF
R2 = 51 Ω
VA
PCB
150 Ω
VMeas 
50 Ω
jR2 C 2f
VRF  0.17VRF for f  150 KHz
1  j R1  R2 C 2f
The « 150 ohms » method aims at measuring the RF voltage
induced at one or several IC output.
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March 17
Susceptibility measurement set-up
Susceptibility measurements – General measurement set-up
Injected level
Extraction
50Ω adapted
cable
Radiated or
conducted coupling
 Harmonic signal
Coupling device
 Coupling network
 Transients
 Antennas
 Burst
 Waveguide
35
Device under test
Power limit
30
Result de-embedding
Port-processing
Forward power (dBm)
Disturbance generation
25
20
15
10
5
0
49
March 17 1
10
100
Frequency (MHz)
1000
Susceptibility measurement set-up
Susceptibility measurements – General measurement set-up
 Typical
signals for susceptibility tests:
Voltage
Voltage
VA 1  m
Amplitude VA
RMS voltage
VRMS
Amplitude VA
V
 A
2
VA 1  m
VRMS 
VA
m2
1
2
2
Time
Time
a) Unmodulated sinus
b) AM modulated sinus
Voltage
Discharge
current
VP  4KV
I P  15 A
8A
Repetition rate
5 or 100 KHz
tr  5ns
Voltage
4A
tr  50ns
Time
Burst period 300 ms
tr  0.8ns 30ns
60ns
Time
Burst duration 0.75 or 15 ms Time
d) Electrical fast transient in burst –
Level 4 on power port (IEC 61000-4-4)
c) Human Body Model ESD at 4
KV (IEC61000-4-2)
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March 17
Susceptibility measurement set-up
Susceptibility measurements –Test procedure for harmonic disturbance
Start
F = Fmin
P = Pmin
Increase P
Increase F
Without RFI
Wait dwell time
Detection mask
Failure or P
= Pmax ?
F = Fmax ?
Save F and P
With RFI
End
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March 17
Failure
Susceptibility measurement set-up
Typical radiated susceptibility test for electronic/electrical products
 Frequency range = 30 MHz/80 MHz – 1 GHz and more
Typical max. RI level:
Commercial product: 3 – 10 V/m
Automotive (ISO-11452-2): 25 – 200 V/m
Military (MIL-STD461E): 20 – 200 V/m
Aeronautics (DO160-D): 8 – 800 V/m
(Siepel)
Field
monitoring
Absorbents
Signal synthesizer
Wide band
(calibrated) antenna
Device under test
1m
1m
Power amplifier
( > 100 W)
R = 3 ou 10 m
1m
ALSE (with
absorbents: semianechoic chamber)
Power supply,
DUT control
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March 17
Susceptibility measurement set-up
Typical conducted susceptibility test for electronic/electrical products
 Bulk Current Injection: 150 kHz – 400 MHz
Signal synthesizer
RF disturbance
Induced current
measurement
Power amplifier
Directional
coupler
Load
LISN
Failure ?
DUT
Bus, cable
Faraday cage

Induced RF
current
Injection
clamp
Measurement
clamp
Interface
Microcontroler
circuit
Usually, the max. current is between 50 mA and 300 mA.
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Conclusion
Does EMC certification cancel the interference risks?
Example: radiated emission limits defined by different EMC standards
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Conclusion
Does EMC certification cancel the interference risks?
A radio receiver operating at 868 MHz has a receiving sensitivity of -90 dBm. Its
radio input is 50 Ω-matched and is terminated by an antenna with an antenna factor
of 10 dB/m. The radio receiver is placed 2 metres from some noisy electronic
equipment with a CE marking, compliant with standard EN 55022 – class B (refer to
Figure 7- 8 for the radiated emission limit defined by EN 55022).
The radiated emission test for the noisy equipment is performed in an ALSE. A
receiving antenna with a gain of 23 dB/m is placed 3 metres in front of the noisy
equipment. The antenna is connected to an EMI receiver by cables and a 30 dB
preamplifier. The total cable loss is equal to 2 dB. The maximum level measured by
the EMI receiver at 868 MHz is 40 dBµV.
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Conclusion
Does EMC certification cancel the interference risks?
1. What is the maximum electric field radiated by the noisy electronic equipment at a distance of 1
metre?
2. According to the details given about the noisy equipment’s radiated emission test, compute the
electric field at 868 MHz at a distance of 3 metres. Does the equipment comply with the limit defined by
EN 55022?
3. Compute the electric field produced by the noisy equipment illuminating the radio receiver at 868
MHz.
4. Compute the voltage and power induced at the radio receiver input.
5. Draw a conclusion about the interference between the noisy equipment and the radio receiver. Do you
think that compliance with EN 55022 is a guarantee against interference?
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Conclusion
Evaluation of emission/susceptibility problems of circuits
Circuit
Emission
issues
Susceptibility
issues
Justification
Driver chip for a
TFT LCD monitor
LDO linear voltage
regulator
Boost converter
IEEE 802.15.4
Zigbee transceiver
chip
FPGA supporting
numerous high
speed interfaces
LIN bus driver for
automotive
application
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