The TRIO Smart Sensor System on a Chip

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Transcript The TRIO Smart Sensor System on a Chip

AMICSA
Methodologies for designing radiation
hardened Analog to digital converters
for space applications.
DUTH/SRL
George Kottaras, E.T. SarrisNick, Stamatopoulos
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•ADCs are very critical in space applications.
(needed in every subsystem, telemetry,
housekeeping, instrumentation, etc)
•Currently there is a high demand for ADCs
and at the same time a lack of availability
•Commercial ADCs suffer from radiation
effects
•TID effects
•SEE effects
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Main Radiation Effects in the ADCs.
•Analog components suffer from TID
effects
•Digital components suffer from SEE
effects.
•RADIATION EFFECTS ON ADCs ARE
VERY TECHNOLOGY DEPENDENT.
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SOLUTIONS AGAINST TID
•Use deep submicron technologies &
•Use enclosed geometry transistors.
TID effects are nearly cancelled.
Potential Problems
•Deep submicron technologies need low Vdds
•Enclosed geometry transistors design rules
•90deg bend gate is not allowed by most technologies=>
More complex designs
•Matching of ELTs is an important issue.
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SOLUTIONS AGAINST TID
•Select appropriate topology for increasing
radiation hardness.
DESIGN RULES FOR SELECTING A TOPOLOGY
•Minimum number of analog comparators (SA, ΣΔ), if possible.
The comparator is most sensitive circuit in the ADC
design. Needs autozeroing to cancel the effects.
•Rely on passive components for voltage/current division
Resistors are preferred since they are immune to TID.
•Perform autozeroing in the digital domain, if possible.
The autozeroing circuits will be more immune to TID.
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SOLUTIONS AGAINST TID
DESIGN RULES FOR ADC peripherals
Usually all ADCs are accompanied by some peripherals such as
S/H amplifiers, instrumentation amplifiers, voltage references,
etc.
Design having in mind that the smaller the common mode
variation of the input of the amplifiers, the more TID immune the
design is going to be. For example, Amplifier A will be more
radhard than amplifier B.
Constant CM
Non Constant CM
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SOLUTIONS AGAINST TID
Autozeroing
Radiation Induced errors are inevitable no matter of the design.
The strategy is to compensate for them. This step is called
autozeroing.
Two possible ways to autozero
•Digital Autozero
Somehow the TID induced offset is quantized and then
digitally removed from the output code of the ADC.
•Analog Autozero
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Perform autozero function on the comparator/s by means
of an error amplifier.
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SOLUTIONS AGAINST TID
Analog Autozeroing
Analog autozeroing involves adding an offset value in the
comparator input so as to cancel that TID induced offset. It is
frequently used in
•Flash ADCs
•Pipeline ADCs
An extra phase is required so that autozeroing can be
performed.
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SOLUTIONS AGAINST TID
Analog Autozeroing
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SOLUTIONS AGAINST TID
Digital Autozeroing
Digital Autozeroing is applied on the output code of the ADC.
Can be easily applied in
•ΣΔ ADCs
•Successive Approximation ADCs
•Current cyclic ADCs.
Usually oversampling is involved.
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A Rad-Hard Successive digitally autozeroed Successive Approximation
ADC
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It consists of
• 2 DACs sharing the same resistive string
• a comparator
• a successive approximation state machine (SASM),
• a temporary register and a subtractor circuit.
The comparator, along with the SASM and one of the two DACs
form the successive approximation ADC.
The temporary register, the subtractor and the auto zeroing DAC
(AZ-DAC) are utilized to perform the digital auto-zeroing function
on the ADC.
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When no auto-zeroing is selected the device works as a nominal 10-bit
successive approximation ADC.
When auto-zeroing is selected, two analogue to digital conversions take
place sequentially and the final result is a combination of the two
conversions.
In the first analogue to digital conversion, the analogue input is converted
by the successive approximation ADC to a digital word (OC1), stored to a
temporary memory location, after being shifted one position left, and fed
to the AZ-DAC.
In the second A/D conversion the analogue input is isolated and the
output of the AZ-DAC, which is the result of the first A/D, is converted to a
digital word (OC2) by the successive approximation ADC. The output
code (OC) comes from the following subtraction
OC=2OC1-OC2
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A Rad-Hard Successive digitally autozeroed Successive Approximation
ADC
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A Rad-Hard Successive digitally autozeroed Successive Approximation
ADC
Assume that in the CM of interest the comparator has
developed offset (in LSBs) off. The result from the first
conversion would be :
OC1=OCideal+off
The second conversion would yiled a code equal to
OC2=OCideal+off+off
The final result wuld be eual to
OC=2OC1-OC2=OCideal
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Offset has been cancelled
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10+1 bits
Use of the above architecture to produce a subranging converter
11 bit
Successive
Approximation
ADC
VDAC
Vin
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Large common mode so Analog AZ is required
Special AZ technique developed
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SOLUTIONS AGAINST SEEs
•Large FFs in the state machine
•P-N good separation => full custom layout
•Use of guardrings => full custom layout
•Watchdog counters to reset the ADC
incase of SEUs.
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