LHCb Vertex Detector and Beetle Chip
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Transcript LHCb Vertex Detector and Beetle Chip
LHCb Vertex Detector and Beetle Chip
Outline:
• Introduction VErtex LOcator
• Pile-up trigger
• Radiation hardness of electronics
• Architecture of Beetle chip
• Test beam results
• Conclusions & outlook
18 December 2002
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Martin van Beuzekom
The LHCb Vertex Locator (VELO)
The VELO provides an accurate
reconstruction of primary &
secondary (displaced) vertices
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Martin van Beuzekom
Vertex Locator
• 21 VELO + 2 Pile-Up stations
• R/ Silicon strip detectors
• ~ 180k strips
• Typical hit resolution 8 mm
• CO2 cooling: 2 kW @-10 C
• Radiation dose 100 kGy (4 years)
• Vacuum feedthrough: 20k pins
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Martin van Beuzekom
RF shielding
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Secondary vacuum
26 A peak current through box
300 mm Al foil
11 mm hole for the beam !!
Detectors are retracted during beam injection
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Martin van Beuzekom
Pile-up trigger (veto)
RA ZPV - ZA
=k
=
Rb
ZPV - ZB
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Detection of multiple primary vertices
R-strip detectors only
L0-trigger: prompt binary signals needed
Processing time < 2.2 ms
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Logic OR of 4 detector signals in Beetle
1024 binary signals @ 80 Mbit/sec
Special (complex) hybrid
Connectivity challenge !
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Martin van Beuzekom
Front-end chip requirements
• 40 MHz sampling rate
• Peaking time < 20 ns
• Remainder of peak after 25 ns < 30 %
(spill over)
• S/N > 14 (300 mm Si)
• L0-trigger rate: 1.1 MHz =>
Readout time 900 ns
• Trigger latency up to 4 ms
• Buffering of 16 events
• Power consumption < 6 mW / channel
• Radiation hardness >100 kGy
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Pulse from charge
sensitive amplifier
time
Martin van Beuzekom
Radiation hardness of CMOS
Problem: Single Event Upsets (SEU) i.e. bit-flips
Cure : Triple redundancy + majority voting for all registers
Problem: Hole trapping in SiO2 (Total Ionizing Dose)
Cure: Use deep submicron process + special layout techniques
MOS transistor characteristics are determined by width (W) and length (L)
V+
Gate oxide
++++
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Martin van Beuzekom
Radiation hardness(2)
• Hole trapping => threshold shift
• Deep Sub Micron process => thinner gate oxide
• Tox < 10 nm : tunneling decreases the
amount of trapped holes in the gate-oxide
• Solution to parasitic transistors: enclosed layout
(only for nMOS)
• Guard rings around nMOS
Field
oxide
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++
Disadvantages of enclosed layout:
• Larger area / capacitance
• No “long” transistors possible
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Martin van Beuzekom
Beetle functional diagram
Beetle chip is designed in 0.25 mm technology
Readout (4x)
Pipeline (186 deep)
Front-end (128 x)
comparator
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Martin van Beuzekom
Beetle front-end
Pulse shape depends on:
• Shaper feedback resistance (Vfs)
• Shaper current (Isha)
Noise is related to the current
in the pre-amplifier (Ipre)
Pre-amplifier:
Ipre
thermal noise
power
Shaper:
slower pulse: noise
10 ns
20 ns
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spillover
25 + 40 ns
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Martin van Beuzekom
Layout of beetle
Beetle:
Designed by ASIC lab
Heidelberg and NIKHEF
• 0.25 mm CMOS technology
• Pipeline depth 186 cells
• Size (5.5 x 6.1) mm2
Front-end (128 x)
Pipeline cells
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Martin van Beuzekom
Radiation hardness test
Vout [V]
Single chips were tested with X-ray facility at CERN
time [ns]
Beetle showed full functionality up to 300 kGy (12 LHCb years):
• All digital functions worked up to 450 kGy
• Analog performance degradations are small
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Martin van Beuzekom
Hybrid & Silicon
• Micron PR02-R detector
– Thickness: 300 mm
– 2048 strips
– pitch: 40 – 92 mm
– length: 6.4 – 66.6 mm
– angular coverage 182°
• 2 layer pitch adapter
• 16 Beetle chips
– High yield
• 4 layer hybrid (NIKHEF design)
– 75 mm kapton / layer
– 17 mm copper / layer
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42 mm
8 mm
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Martin van Beuzekom
Test beam setup
Trigger scintillators
120 GeV pions / muons
X-Y Si tracking station
Hybrid under test
“Continuous” beam => no fixed relation between
particle and Beetle clock signal (40 MHz)
• Readout 8 time samples of Beetle
• Measure time between trigger and next Beetle clock
time
Collected > 10 Million events in 4 days
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Martin van Beuzekom
Pulse shape analysis
Data after baseline correction & common mode noise subtraction
Noise distribution
s=1
Most probable
value
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Martin van Beuzekom
Pulse shape analysis (2)
Peak height
(Signal)
Spill over
25ns
Rise time (10 to 90 %)
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Martin van Beuzekom
S/N results
Short strips:
• Sstrip/Nstrip = 19
• Spill over = 32 %
Long strips:
• Sstrip/Nstrip = 13
• Spill over = 37 %
• The new design of the silicon sensor will have only 45 strips
=> expected S/N of long strips > 15
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Martin van Beuzekom
Conclusions
• Radiation hardness of Beetle demonstrated up to 300 kGy
• Performance degradation due to hybrid is minimal
• Pulse shape characteristics:
• Spill over < 30 %
• S/N > 15
• Beetle is compliant with all LHCb requirements
• Beetle was chosen by VELO group
• Inner tracker will also use Beetles
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Martin van Beuzekom
Outlook
• Next version of Beetle (1.2) + next
version of hybrid is planned to be tested
in the test beam of summer 2003
• Small design improvements => new
Beetle (1.3) submission in spring 2003
• The more complex Pile-Up hybrid is
currently under construction (4 times
more signals!), to be tested
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Martin van Beuzekom
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Martin van Beuzekom
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Martin van Beuzekom
Radiation effects
Total Dose effects
Ionising
Non-Ionising
Silicon
Detectors
Bulk damage
Bulk damage
Readout
chips
Hole trapping
(SiO2)
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Single Event effects
Upsets
Damage
Yes
Latch-up
Triple redundancy No problem
+majority voting For LHCb
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Martin van Beuzekom
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Martin van Beuzekom