Transcript Semicon Tester

www.qmaxtest.com
BS Test & Measurement Technique
for
Modern Semi-con devices & PCBAs
www.qmaxtest.com
 QMAX a market leader in ATE for PCBA and
Semiconductor industry.
7/7/2015
© Qmax Test Technologies Pvt Ltd., 1997-2008
2
www.qmaxtest.com
QMAX Key Customer Segments
 DEFENCE
 AEROSPACE
 RAILWAYS
 R&D LABS
 INDUSTRIAL AUTOMATION
 SEMI-CON
 TELECOM
 AUTOMOBILE
 BIO-MEDICAL
 EDUCATION
7/7/2015
© Qmax Test Technologies Pvt Ltd., 1997-2010
3
www.qmaxtest.com
Evolution of IC Packaging
DIP
PGA
7/7/2015
SOIC
SOJ
QFP
PLCC
4
www.qmaxtest.com
Evolution of IC Packaging-Cont...
QFN
BGA
7/7/2015
5
www.qmaxtest.com
Leading to->Evolution in PCBA
Surface
Onlyand
DIP
SOIC
Mount
Package
BGAs
SOIC,PLCC
packages
Majority
BGA Pkg
7/7/2015
6
www.qmaxtest.com
Evolution summary
 Silicon Technology growth lead to miniaturization of
device packaging , leading to ….
 Surface mount packaging styles, leading to ….
 Double Sided and Multilayered PCBs , leading to ….
 Reduced or almost no access to test pins or pads
7/7/2015
© Qmax Test Technologies Pvt Ltd., 1997-2008
7
www.qmaxtest.com
The Problem ?
 How to test for manufacturing defects in
 Mass Production
 Hardware Design Houses
 PCBA Repair and Recovery Industry
7/7/2015
8
www.qmaxtest.com
The Solution
IEEE Std 1149.1 -JTAG Boundary Scan Standard
This allows pin level access to BS compliant devices independent of
the packaging technology via a 4 wire serial interface.
7/7/2015
© Qmax Test Technologies Pvt Ltd., 1997-2008
9
www.qmaxtest.com
Boundary Scan Chip Architecture
DIGITAL
LOGIC
TAP CONTROLLER
SCAN CELLS
TAP CONTROLLER
JTAG TAP
Interface Signals
TDI
TMS
TRST*
TDO
TCLK
7/7/2015
10
www.qmaxtest.com
Using the Boundary Scan Path
PCB
TDI
DIGITAL
LOGIC
DIGITAL
LOGIC
DIGITAL
LOGIC
DIGITAL
LOGIC
TCK
TMS
TDO
7/7/2015
11
www.qmaxtest.com
Boundary Scan with Multiple Chips
7/7/2015
© Qmax Test Technologies Pvt Ltd., 1997-2008
12
www.qmaxtest.com
JTAG-4 wire serial communication
7/7/2015
© Qmax Test Technologies Pvt Ltd., 1997-2008
13
www.qmaxtest.com
Boundary Scan Tests
Cluster Testing
Memory
Interconnect Test
Interconnect
Test
Core Logic
Test ( BIST)
Scan Chain
Test
7/7/2015
Non-BS Devices Functional Test
© Qmax Test Technologies Pvt Ltd., 1997-2008
14
www.qmaxtest.com
Boundary Scan Tests-Cont…
Digital I/o Via Edge Connector enhance test coverage
7/7/2015
Same IEEE 1149.1 BS Test Port can be used for
In-System Programming of CPLDs, FPGA & Flash
© Qmax Test
Pvt Ltd.,
1997-2008
Memory following
theTechnologies
IEEE 1532
Standard.
15
www.qmaxtest.com
IEEE Std 1532 Concept
7/7/2015
16
www.qmaxtest.com
Benefits of IEEE1532
 Allows configuring, programming, read back, verify,
erase of programmable devices after it has been
assembled on the PCB.
 Allows concurrent programming which improve
significantly the time it cost to program a board with
several programming devices.
 Eliminate the need to have multiple vendor
programming tools to program their respective
devices.
7/7/2015
© Qmax Test Technologies Pvt Ltd., 1997-2008
17
www.qmaxtest.com
Qmax ProductsEngineering Labs & Academy
QMAX - QSCAN-QT900
7/7/2015
© Qmax Test Technologies Pvt Ltd., 1997-2008
18
www.qmaxtest.com
QT900-Boundary Scan Test System
7/7/2015
© Qmax Test Technologies Pvt Ltd., 1997-2008
19
www.qmaxtest.com
QT900 Testing BGA based PCB
7/7/2015
© Qmax Test Technologies Pvt Ltd., 1997-2008
20
www.qmaxtest.com
QT-PXI-95 Controller and Digital Card
7/7/2015
© Qmax Test Technologies Pvt Ltd., 1997-2008
21
www.qmaxtest.com
QST4416-FC
Linear & Mixed signal Test system
7/7/2015
22
www.qmaxtest.com
QST4416-FC Tester Contents



Standard PC with PCI or PCIe interface
Calibration Kit – Keithley 2100 USB
Power Supply Modules











7/7/2015
± 54V Analog
± 15V_Analog
± 5V_Analog
+5V_ Digital
+ 3.3V_Digital
QST4416FC Test system – 6U, 9 slots
cabinet with freely configurable Analog and
Digital Instrumentations
Handler Interface
Manipulator – Optional ( 3 models)
GPIB interface - Optional
Testing utility – QST Comprehensive
System software
Application specific Load boards
© Qmax Test Technologies Pvt Ltd., 1997-2010
23
www.qmaxtest.com
7/7/2015
© Qmax Test Technologies Pvt Ltd., 1997-2010
24
www.qmaxtest.com
Qmax Product Package
 A Complete package with Tutorial and practical
sessions from
 What is Boundary Scan ?
To
 How its used to test latest Digital IC, In-Circuit and
Out Circuit mode.
 ( Covering both the IEEE 1149.1 and IEEE 1532
Standards)
7/7/2015
© Qmax Test Technologies Pvt Ltd., 1997-2008
25
www.qmaxtest.com
 What do I learn from Test Engineering
Course ?
 Get to know the depth of Semiconductor IC Testing, out-circuit & In





circuit.
The right way to test a Populated PCB, Simple to complex
Aware of the various ATEs’ and the System requirements for Board
level and component level testing.
Various Techniques & Technologies involved to test and troubleshoot
simple to complicated ICs on board.
Art of parametric Testing.
Challenges faced in today’s Testing & the need of Design for
Testability( board level & component level ) , its limitations.
Introduction to PCB Design and how it plays major role in PCBA
Industry.
www.qmaxtest.com
 Any possible Career Opportunities?
 Product Application Development Engineer
 PCBA Industry (Design & Development, Repair, QA )
 ATE Hardware Design Engineer
 Hardware Test Engineer
 Hardware Test Development Engineer
 PCB Layout & Design Engineer
www.qmaxtest.com
 Time for QUESTIONS
7/7/2015
© Qmax Test Technologies Pvt Ltd., 1997-2008
28
www.qmaxtest.com
You can visit us at
www.qmaxtest.com
From
Rajiv VK
DGM-Technology Development
Qmax Test Equipments Pvt., Ltd.,