Non-MOSFET Based Memory
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Transcript Non-MOSFET Based Memory
NON-MOSFET BASED MEMORY
Alex Rodriguez-Triana
Terence Frederick
April 21, 2008
OUTLINE
MOSFET Based RAM Memory
Problems with MOSFET Memory
Scaling
Alternative Memory
DRAM, SRAM, FLASH
MRAM
FeRAM
PCRAM
Summary
HISTORY OF MOSFET MEMORY
Concept goes back to the 1960s
People were speculative
BJT was more advanced and faster
Leakage current
They were attractive
Simple Processing
Layout Advantages
Leads to high-density integrated circuits
HISTORY OF MOSFET MEMORY
SRAM were proposed
six MOSFET’s per cell
SRAM began to be used in the mid-70s
DRAM patented in 1968
1 MOSFET, 1 Capacitor
First commercial DRAM
1971 by Intel
DYNAMIC RAM
Most common type of RAM memory
Arranged in a square array
one capacitor and transistor per cell
Stores one bit per cell
Recharging/Refreshing : capacitors lose their charge
Rows: Word Lines
Columns: Bit Lines
ADVANTAGES/DISADVANTAGES OF DRAM
Advantages
Cost
Small
Number of Read/Write Cycles
1T & 1C vs. 6T for SRAM
> 10^15
Disadvantages
Slow
Need to refresh
Volatile
Data is lost when memory is not powered
STATIC RAM
Memory cell uses flip-flop to store bit
Requires 6 transistors
Each bit is stored on 4 transistors that form two
inverters
Two other transistors control the access to a cell
during read and write operations
This storage cell has two stable states
0 and 1
ADVANTAGES/DISADVANTAGES OF SRAM
Advantages
Performance better than DRAM
Faster
Less Power Hungry
Number of Read/Write Cycles
> 10^15
Disadvantages
Cost
More than DRAM
Volatile
Data is lost when memory is not powered
FLASH MEMORY
Invented by Dr. Fujio Masuoka at Toshiba in
1984
Stores information in an array of memory cells
made from floating-gate transistors
Single-Level Cell Devices - each cell stores only
one bit
ADVANTAGES/DISADVANTAGES OF FLASH
Advantages
Cost
Non-Volatile
Does not lose information when the power is off
Low Power
Fast Erase
Large blocks rather than one word at a time
Disadvantages
Number of Read/Write Cycles
~ 10^6
Slow Write
Entire block must be read, word updated, then entire block
written back
FUTURE OF MOSFET MEMORY
Current memory technologies are nearing the
end
Main issue with MOSFET RAMs
Scalability
Designers put more components onto each chip
Width of the smallest features is shrinking
Existing memory technologies will be good for
several more generations
130 nm in 2000 to 45 nm today
Unlikely to make the transition to 22 nm (scheduled
for 2011) or 16 nm (2018)
New types of technologies
MRAM, FeRAM, PCRAM
MOSFET SCALING
Late 1990s
Scaling resulted in great improvement in MOSFET
circuit operation
Reasons for smaller MOSFETs
Same functionality in a smaller area
Reduces cost per chip
Smaller ICs allow for more chips on a wafer
Fab costs for wafer are relatively fixed
MOSFET SCALING
Problems when scaling too small
Slower chip speed
Operational problems
Greater delay due to interconnects
Higher sub-threshold, increased gate-oxide and junction
leakage, lower transconductance, heat production, and
process variation
Simulation
Difficult to predict what the final device will look like
Modeling of physical processes
Microscopic variations in structure due to the probabilistic
nature of atomic processes require statistical predictions
ALTERNATIVE TECHNOLOGIES
Magnetic RAM (MRAM)
Ferroelectric RAM (FeRAM)
Phase Change RAM (PCRAM)
MAGNETORESISTIVE RAM
Under development since the 1990s
Data is stored by magnetic storage elements
Formed from two ferromagnetic plates
Plates can hold a magnetic field
Polarization doesn’t leak away with time like charge
Less wear since switching states doesn’t involve
movement of electron or atoms
One plates is a permanent magnet
Set to a certain polarity
Second plate’s field will change to match that of an
external field
A memory device is built from a grid of "cells"
4MB MRAM
1st commercial available MRAM
Based on 1T and 1 magnetic tunnel junction
Isolates read and write path
Separates programming components from the
sense circuit
Improved performance
READ AND WRITE OF MRAM
Read
Current is passed
through the bit
resistance of the
bit is sensed
Write
Current is passed through
the programming lines
Induced magnetic field is
created at the junction,
which the writable plate
picks up
MRAM
Cell works in a toggling mode
Same direction
Low resistance state (0)
Opposite direction
High resistance state (1)
MRAM IN EMBEDDED SYSTEMS
Inserted late in the SC fabrication process
Low temperature
Compatible with CMOS processing
Consolidate multiple MRAM into one
highly reliable NVRAM
Less complexity
High performance RD/WR
ADVANTAGES/DISADVANTAGES OF MRAM
Advantages
Non-volatile
Does not require programming sequences or block erasing
Very fast RD/WR and unlimited endurance
Simple device Architecture and easy software
development
Due to easy write and overwrite
Disadvantages
Scalability of magnetic domain?
Disturbance of neighboring cells when put close
together
Might have the same problems as a transistor
Leads to false writes
High power needed to write
Ferroelectric RAM
Borrows concepts from DRAM
most popular design follows the 1T1C design concept
similar/same write process
Similarity to Floating Gate Design
write accomplished by applying charge that is stored in
capacitor
1T design
Also reminiscent of MRAM
focuses on ferroelectric properties, whereas MRAM
techniques often focus on ferromagnetic properties
both characteristics take form of hysteresis loop
Structure
1T type
Similar to normal
transistor
Identical to floating gate
design where floating
gate is ferroelectric
material
1T1C type
ferroelectric material
serves ONLY as
capacitor
“Recent Progress in Ferroelectric Memory
Technology”
by Hiroshi Ishiwara
Introduction
Two major focuses in the paper
developing a better material to deal with leakage
currents in 1T1C FeRAM
Improve upon 1T FeRAM design
replace some Fe in lattice with Mn
create MFIS-FET
Introduce a new 1T2C FeRAM design
Results I
1T2C Design
2 Ferroelectric capacitors
of the same size connected
to the gate of the
transistor
capacitors polarized
opposite the gate
Good performance
non-destructive data
reads
good data retention time
high on/off current ratio
Advantages/Disadvantages of FeRAM
Advantages
lower power usage
faster write speed
greater number of rewrites
already being mass-produced
Disadvantages
still more research to be done on reliability (i.e. high
NRE cost)
only applicable to a small niche
“Study of Phase Change Random Access
Memory (PCRAM) at the Nano-Scale”
by R. Zhao, L.P. Shi, W.J. Wang, H.X. Yang, H.K. Lee,
K.G. Lim, E.G. Yeo, E.K. Chua and T.C. Chong
Introduction
RAM based on floating-gate design (i.e. Flash
memory) will soon meet physical limitations
interpoly tunneling
intercell crosstalk
Flash memory is the most prevalent non-volatile
memory on the market
a viable option must be found soon
PCRAM may be that option
Fabrication/Design
“Bybrid” process used to etch
the layers
Electronic Beam
Lithography (EBL)
Optical Lithography
Electrodes made of TiW
Dielectric is common SiO2
Phase Change material is
Ge2Sb5Te2
Feature size refers to contact
between PC and bottom
electrode
How it Works
Unique Phase Change material has two states
Crystalline state has low resistance and represents a
stored ‘1’
Amorphous state has high resistance and represents
a stored ‘0’
To change bit from 1 to 0 (i.e. RESET), a
relatively high voltage is applied for a short time
such that the compound melts but is not able to
recrystallize
To change bit from 0 to 1 (i.e. SET), a lower
voltage is applied for a longer time so that
compound can crystallize
Simulation
Pulse generator created to
produce short (<10ns)
signal
Known resistance placed
in circuit
Voltages measured to
determine drop across
resistor
Current into PCRAM
approximately (V1-V2)/Rload
Cells with feature sizes
ranging from 40 to 200 nm
created
same wafer used
Results
Advantages/Disadvantages of PCRAM
Advantages
great scalability
fast for both reads and writes
low current required to program
Disadvantages
as of yet, only in the research phase
still limited read/write accesses (108)
SUMMARY
SRAM
DRAM
FLASH
MRAM
FeRAM PCRAM
Read Speed
Fast
Medium
Fast
Fast
Fast
Fast
Write Speed
Fast
Medium
Slow
Fast
Medium
Fast
Non-Volatile
No
No
Yes
Yes
Yes
Yes
Endurance
Infinite
Infinite
Limited
Infinite
Limited
Limited
Low Voltage
Yes
Limited
Limited
Yes
Limited
No