Transcript Secondary-Electron-Emission-and-Photoemission

Secondary Electron Emission and
Photoemission Tests
Keithley Meters
• Keithley sourcemeters were delivered a few weeks ago
• Finished initial programming in Labview to control these
meters
• We plan on attaching the meters to the system this week
• We have configured the meters to control an applied voltage to
the sample, which will allow us to vary the energy of the
incident electrons
• An applied positive voltage to the detector will allow better
collection of secondary electrons
• These voltage must be carefully tuned so that the primary
electrons are not deflected away from the sample
SEE and LEEDS
• We are currently investigating methods for
pulsing the electron gun for the LEEDS setup
– This should allow for the limited testing of some
low conductivity materials
– While the power supply does not have a method to
pulse, it may be possible to redirect the beam
Photoemission
• There will be some delay for photoemission
– This will involve some work within the XPS
system, taking it offline.
– Modification of the sample holder will be
necessary to direct light from the source to the
sample
– Significant relocation of electrical equipment will
be required
– My primary concern at the moment will be SEE