Transcript T o

Homework #1 – Due 09/09/14
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2.2
2.3
2.7
2.13
2.20
Matthiessen’s Rule
 = T + I
 = effective resistivity, T = resistivity due to scattering by thermal
vibrations only, I = resistivity due to scattering of electrons from
impurities only.
 = T +  R
 = overall resistivity, T = resistivity due to scattering from thermal
vibrations, R = residual resistivity
Residual resistivity shows very little temperature dependence, while T = AT.
Therefore, effective resistivity is given by:
 = AT + B
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)
Definition of Temperature Coefficient of Resistivity
The fractional change in the resistivity per unit temperature increase at the
reference temperature To
1   
o   
 o  T  T To
o = TCR (temperature coefficient of resistivity),  = change in the
resistivity ( =  - o), o = resistivity at reference temperature To , T
= small increase in temperature (T = T – To), To = reference temperature
Temperature Dependence of Resistivity
 [1 + o(TTo)]
 = resistivity, o = resistivity at reference temperature, 0 = TCR
(temperature coefficient of resistivity), T = new temperature, T0 =
reference temperature
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)
Temp. Dependence of Resistivity
• When the resistivity follows the linear behavior
previously mentioned:
 = AT + B
• Then, in
1   
o 
 o  T  T T
o
• The o is constant over a temperature range
To to T and leads to:
 [1 + o(TTo)]
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)
Actually dominated by the
residual resistivity; thus,
relatively insensitive to temp
Fig 2.7
Magnetic materials (e.g., iron and
nickel) do not follow the expected
dependence
-Besides lattice vibrations, these
materials are also affected by the
magnetic interactions between
ions in the lattice
Expected linear dependence
The resistivity of various metals as a function of temperature above 0 °C. Tin melts at
505 K whereas nickel and iron go through a magnetic to non-magnetic (Curie)
transformations at about 627 K and 1043 K respectively. The theoretical behavior
( ~ T) is shown for reference.
[Data selectively extracted from various sources including sections in Metals Handbook,
10th Edition, Volumes 2 and 3 (ASM, Metals Park, Ohio, 1991)]
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)
• Resistivity v. temperature
behavior of pure metals can
be empirically represented as:
Fig 2.8
• Obviously, the overly simple
linear prediction does not
represent resistivity at low
temperatures
• Lattice vibrations reduce
rapidly as temp reduces;
therefore less scattering and
simple model no longer works
The resistivity of copper from lowest to highest temperatures (near melting temperature,
1358 K) on a log-log plot. Above about 100 K,   T, whereas at low temperatures,
 T 5 and at the lowest temperatures  approaches the residual resistivity R. The inset
shows the  vs. T behavior below 100 K on a linear plot (R is too small on this scale).
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)
Power law fit:
-Notice near unity for pure metals
-Closer to 2 for the magnetic
Fig 2.8
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)
Solid Solutions and Nordheim’s Rule
• Isomorphous alloy of two metal (a binary
alloy that forms a solid solution) is expected
to follow:
 = T + I
– Along with temp-independent I increasing with
the concentration of solute atoms
• This means that as the alloy concentration
increases, the resistivity increases and
becomes less temperature dependent as I
overwhelms T
• This can be an advantage
of alloying metals
Fig 2.8
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)
• This table shows how alloying metals can affect the
resistivity
• “Buried” in this table is that when you alloy 80% nickel with
20% chromium, the resistivity of nickel increases almost 16
times!!
• This alloy is known as Nichrome, and it is used as a heater
wire in household appliances and industrial furnaces
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)
(a) Phase diagram of the Cu-Ni alloy system. Above
the liquidus line only the liquid phase exists. In the
L + S region, the liquid (L) and solid (S) phases
coexist whereas below the solidus line, only the
solid phase (a solid solution) exists.
(b) The resistivity of the Cu-Ni alloy as a Function
of Ni content (at.%) at room temperature
• Both metals are FCC with Cu being only
~3% larger, so the alloy will remain FCC
• When Ni is added to Cu, the I in the
Matthiessen expression will increase
• Obviously, as the alloy becomes more Nirich (i.e., becoming pure Ni), resistivity
reduces as it should for pure metals
Fig 2.11
The Cu-Ni alloy system. SOURCE: Data extracted from Metals Handbook, 10th ed., 2 and 3
Metals Park, Ohio: ASM, 1991, and M. Hansen and K. Anderko, Constitution of Binary
Alloys, New York: McGraw-Hill, 1958.
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)
Nordheim’s Rule for Solid Solutions
An important semi-empirical equation that can be used to
predict the resistivity of an alloy is Nordheim’s Rule:
I = CX(1 X)
I = “impurity” resistivity due to scattering of electrons from
impurities
C = Nordheim coefficient: represents the effectiveness of the solute
atom in increasing the resistivity; assumes a dilute alloy mixture
X = atomic fraction of solute atoms in a solid solution
The Nordheim Rule Eqn. relates impurity resistivity to the
atomic fraction X of the solute atoms in a solid solution
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)
• C depends on the type of solute and the solvent
• A solute atom that is drastically different in size to solvent atom will produce a larger
I, and therefore, lead to a larger C
• An important assumption in Nordheim’s rule is that alloying does not significantly vary
the number of conduction electrons/atom in the alloy
• This is true for alloys with the same valency (i.e., same column on the Periodic Table)
• However, it is not true for alloys with different valencies
• To correct for this, C must change to provide an effective Nordheim coefficient Ceff
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)
Combined Matthiessen and Nordheim Rules
 = matrix + CX(1 X)
 = resistivity of the alloy (solid solution)
matrix = resistivity of the matrix due to scattering from
thermal vibrations and other defects
C = Nordheim coefficient
X = atomic fraction of solute atoms in a solid solution
C assumes a dilute alloy mixture
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)
Fig 2.12
Electrical resistivity vs. composition at room
temperature in Cu-Au alloys. The quenched
sample (dashed curve) is obtained by
quenching the liquid, and the Cu and Au
atoms are randomly mixed. The resistivity
obeys the Nordheim rule. When the quenched
sample is annealed or the liquid is slowly
cooled (solid curve), certain compositions
(Cu3Au and CuAu) result in an ordered
crystalline structure in which the Cu and Au
atoms are positioned in an ordered fashion in
the crystal and the scattering effect is reduced.
• In solid solutions, at some concentrations of certain binary alloys, the
annealed solid has an orderly structure where the two elements are not
randomly mixed, but occupy regular, ordered sites
• These can actually be viewed as a pure compound – like Cu3Au and CuAu
• Their resistivities will be less than the same composition random alloy due
to being quenched from the melt
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)
Resistivity of Mixtures and Porous Materials
Consider a material with two distinct phases  and b, as described below:
The effective resistivity of a material with a layered structure.
(a) Along a direction perpendicular to the layers.
(b) Along a direction parallel to the plane of the layers.
(c) Materials with a dispersed phase in a continuous matrix.
Fig 2.13
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)
Effective Resistance of Mixtures
Example: Effective resistivity for current flow in the x direction
L  Lb b
Reff 

A
A
Reff = effective resistance
L = total length (thickness) of the -phase layers
 = resistivity of the -phase layers
A = cross-sectional area
Lb = total length (thickness) of the b-phase layers
b = resistivity of the b-phase layers
c = volume fractions of the phases
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)
Resistivity-Mixture Rule
eff = c cbb
eff = effective resistivity of mixture, c= volume fraction of the phase,  = resistivity of the -phase, cb = volume fraction of the bphase, b= resistivity of the b-phase
Conductivity-Mixture Rule
eff = c cbb
eff = effective conductivity of mixture, c= volume fraction of the
-phase,  = conductivity of the -phase, cb = volume fraction of
the b-phase, b= conductivity of the b-phase
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)
Non-ideal Case
• Those two rules pertain to two special
cases
• However, in general, a random mixture of
the two phases usually exists
• Therefore, we would not expect either
equation to apply rigorously
• If resistivity of one phase is very different
than the other, there are two semiempirical rules that are quite useful
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)
Mixture Rule (d > 10c )
eff
1
(1  cd )
2
 c
(1 c d )
Dispersed phase is
much more resistive
with respect to the
continuous phase
eff = effective resistivity, c = resistivity of continuous phase, cd =
volume fraction of dispersed phase, d = resistivity of dispersed phase
Mixture Rule (d < 0.1c )
eff
(1  c d )
 c
(1  2 c d )
Dispersed phase is
much less resistive
with respect to the
continuous phase
eff = effective resistivity, c = resistivity of the continuous phase, cd
= volume fraction of the dispersed phase, d = resistivity of the
dispersed phase
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)
Two-Phase Alloy Resistivity and Electrical Contacts
Eutectic-forming alloys, e.g., Cu-Ag.
(a) The phase diagram for a binary,
eutectic-forming alloy.
(b) The resistivity versus composition
for the binary alloy.
Fig 2.15
• For most compositions, alloys form a
two-phase heterogenous mixture of
phases  and b as shown in the figure
• Between 0 and X1,  increases with the
concentration by virtue of Nordheim’s
rule
• At X1, the solid solubility limit of one
metal into another is reached. Now,
two phases are present, so  is given
by the resistivity-mixture rule
• As with the 0 to X1 region, at the other
metal end, between X2 and 100%, the
resistivity becomes Nordheim’s rule
again because only one phase exists
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)
Hall Effect
Fig 2.16
• “Electron as a particle” allows to
us to readily explain the Hall effect
• Magnetic field is applied
perpendicular to the direction of
both the applied field that is driving
the current
• The result is a transverse field in
the sample that is perpendicular to
the direction of both the applied
field, Ex, and the magnetic field, Bz
• The Hall voltage can be obtained
• Applied electric field drives a
current Jx where the electrons
move in the –x direction with drift
velocity vdx.
Illustration of the Hall effect.
The z direction is out of the plane of the paper. The externally applied magnetic field is
along the z direction.
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)
Hall Effect (cont.)
• Due to the magnetic field, there is
a force, known as the Lorentz
force, acting on each electron
given by
• The direction of this Lorentz force
is in the –y direction and governed
by the vector product
Fig 2.16
• Since Lorentz force is in the –y
direction, electrons are forced
downward
• As a result, negative charge builds
up near the bottom and positive at
the top due to exposed metal ions
https://www.youtube.com/watch?v=R9Jpi2bIiU8
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)
F = qv  B
F = force, q = charge, v = velocity of charged particle, B = magnetic
field
Fig 2.17
A moving charge experiences a Lorentz force in a magnetic field.
(a) A positive charge moving in the x direction experiences a force downwards.
(b) A negative charge moving in the -x direction also experiences a force downwards.
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)
Lorentz Force
• Accumulation of electrons near the bottom results in an internal electric field, EH, in
the –y direction. This is called the Hall field and give rise to the Hall voltage, VH
between the top and bottom of the sample
• Electron accumulation continues until the increase in EH is sufficient to stop further
accumulation
• When this happens, the magnetic force that pushes the electrons down just
balances the force eEH, that prevents further accumulation, so at steady state:
• However:
• Therefore, we can substitute for vdx to obtain:
Hall Coefficient
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)
Definition of Hall Coefficient
RH 
Ey
J x Bz
• Measures the resulting Hall field, along y, per unit
transverse applied current and magnetic field
• The larger the RH, the greater the field
• Therefore, RH is a gauge of the magnitude of the
Hall effect
RH = Hall coefficient, Ey = electric field in the y-direction, Jx = current
density in the x-direction, Bz = magnetic field in the z-direction
From Principles of Electronic Materials and Devices, Third Edition, S.O. Kasap (© McGraw-Hill, 2005)