Transcript GOUSIOU_TWEPP09x

TWEPP Paris, 09
Radiation Tests on the complete system
of the instrumentation electronics
for the LHC Cryogenics
at the CNGS test facility
Evangelia Gousiou CERN TE CRG
Outline
o Overview of the Cryogenic Instrumentation Electronics
o Radiation tolerance strategy
o CNGS Test Facility
o Test Setup
o Test Results
o Conclusions
Outline
o Overview of the Cryogenic Instrumentation Electronics
o Radiation tolerance strategy
o CNGS Test Facility
o Test Setup
o Test Results
o Conclusions
The Cryogenic Instrumentation Electronics
o ~10.000 electronic boards assembled in ~800 crates, all around the LHC tunnel and
in “protected areas”.
• Conditioners: measure temperature, pressure, He level
• Actuators: AC and DC electrical heaters
o All electronics will be subject to radiation (ionizing, non-ionizing dose and SEE).
o Manufactured mainly with COTS that have been prequalified, since space or
military technologies were incompatible with the project budget.
->-> Replacements foreseen during maintenance campaigns.
Conditioner Channels Architecture
ASIC
ADC
FPGA
Temp.
Sensor
ASIC
ADC
FPGA
MUX
Pressure
Sensor
Conditioner card (holds 2 independent channels)
Conditioner Channels Architecture
ADC
ADC
FPGA
FPGA
FPGA
Conditioner card (holds 2 independent channels)
MUX
Temp.
Sensor
ASIC
ASIC
ASIC
ADC
MUX
MUX
MUX
Pressure
Sensor
ASIC
ADC
FPGA
ASIC
ADC
FPGA
ASIC
ADC
FPGA
SRAM
FPGA
WFIP Communication card
(for up to 7 cards)
WorldFIP
AGENT
Conditioner Channels Architecture
ADC
ADC
FPGA
FPGA
FPGA
Conditioner card (holds 2 independent channels)
WorldFIP FIELDBUS
MUX
Temp.
Sensor
ASIC
ASIC
ASIC
ADC
MUX
MUX
MUX
Pressure
Sensor
ASIC
ADC
FPGA
ASIC
ADC
FPGA
ASIC
ADC
FPGA
SRAM
FPGA
WFIP Communication card
(for up to 7 cards)
WorldFIP
AGENT
Conditioner Channels Architecture
FPGA
FPGA
FPGA
ADC
ADC
Conditioner card (holds 2 independent channels)
MUX
Temp.
Sensor
ASIC
ASIC
ASIC
ADC
MUX
MUX
MUX
Pressure
Sensor
ASIC
ADC
FPGA
ASIC
ADC
FPGA
ASIC
ADC
FPGA
SRAM
FPGA
WorldFIP
AGENT
WFIP Communication card
(for up to 7 cards)
WorldFIP FIELDBUS
Features
Features
forfor
high
accuracy
high
accuracy
o
Continuously auto-calibrated system:
•
•
•
Comparison with a reference on each measurement for gain drift correction.
Voltage polarity inversion on each measurement for offset correction.
Excitation current inversion for compensation of thermocouple effects.
Outline
o Overview of the Cryogenic Instrumentation Electronics
o Radiation tolerance strategy
o CNGS Test Facility
o Test Setup
o Test Results
o Conclusions
Radiation tolerance strategy
Components Selection
o
Rad-hard ASIC, Voltage Regulator
developed at CERN
o
Anti-fuse FPGA
o
WorldFIP agent using signal transformer
rather than optical insulators
o
Radiation tests on COTS in dedicated test
facilities
Radiation tolerance strategy
Components Selection
Rad-hard ASIC, Voltage Regulator
o
Triple module redundancy on FPGA logic
developed at CERN
o
Frequent refreshment of WorldFIP
o
Anti-fuse FPGA
o
WorldFIP agent using signal transformer
rather than optical insulators
o
Radiation tests on COTS in dedicated test
agent’s SRAM memory to reduce error
probability
Conditioner
Card
1s
FPGA
20ms
SRAM
WorldFIP Communication Card
facilities
o
Overdesign of power supplies and
thermal dissipators
1s
WorldFIP
FIELDBUS
o
Mitigation Techniques
Radiation Test Campaigns
LHC Tunnel Electronics
o Tests in dedicated test facilities for all the
components (ITN-Portugal, UCL-Belgium,
PSI-Switzerland, CERN-Switzerland).
Protected Areas Electronics
o Radiation levels underestimated
-> -> Electronics not designed to stand
radiation.
The test campaign at CNGS aims at
Validating the performance of the complete systems for both cases (tunnel and
protected areas).
Outline
o Overview of the Cryogenic Instrumentation Electronics
o Radiation tolerance strategy
o CNGS Test Facility
o Test Setup
o Test Results
o Conclusions
Why CNGS?
o Tests of complete systems (crates)
o Exposure to LHC-like radiation field
o Good knowledge of radiation levels from simulations and real time
monitoring
o Free of charge!
Ducts
Neutrino Beam
.
.
.
Gran Sasso
(Italy)
2ndary Beam
Main Tunnel
Graphite
Target
Particle
Shower
Proton Beam
Service Gallery
The CNGS Test Facility
CERN
Ducts
Neutrino Beam
.
.
.
Gran Sasso
(Italy)
2ndary Beam
Main Tunnel
DUT
Graphite
Target
Particle
Shower
Proton Beam
Service Gallery
The CNGS Test Facility
CERN
DUT
Ducts
Particle
Shower
Neutrino Beam
2km
…
…
Ctrl Room
2ndary Beam
.
.
.
Gran Sasso
(Italy)
We are provided with
Graphite
Target
o WorldFIP Communication
o Mains
o Real Time Rad Monitors
Proton Beam
Main Tunnel
Service Gallery
The CNGS Test Facility
o 2 x 48pins Connectors
CERN
Outline
o Overview of the Cryogenic Instrumentation Electronics
o Radiation tolerance strategy
o CNGS Test Facility
o Test Setup
o Test Results
o Conclusions
Equipment to Test
o 2 Cryogenic Instrumentation Crates fully equipped with Conditioners, Actuators,
Communications and Power Supply Cards:
o 25 Cards (=50 channels) of LHC tunnel electronics
o 8 Cards (=16 channels) of “protected areas” electronics
Test Setup
o Testing conditions:
• Fixed loads to conditioner channels
• Fixed set points to actuator channels
• 4 thermometers in different locations
o On line measurements on DUT:
•
WorldFIP data as in the LHC control system
•
Current Consumption and Voltage Levels
Testing Periods
o 1 month dry run tests to confirm electronics and measurements reliability.
o 1.5 months at low dose radiation station:
TID (Gy)
18
NIEL (n/ cm2)
2.6e+11
>20MeV (h/ cm2)
1.3e+11
+
o 1.5 months at high dose radiation station:
TID (Gy)
NIEL (n/ cm2)
>20MeV (h/ cm2)
105
3.6e+12
2e+12
Outline
o Overview of the Cryogenic Instrumentation Electronics
o Radiation tolerance strategy
o CNGS Test Facility
o Test Setup
o Test Results
o Conclusions
Protected Areas Electronics
1. AC Heater Actuators Overview
o Cumulative effects failures:
TID (Gy)
5
NIEL (n/ cm2)
7e10
LHC years
0.3
in the worst case
-> Failing component: Solid state relay
->-> Solutions for the LHC: Moving of electronics, shielding of protected areas.
o Same results for 6 channels and reproduced in two different CNGS locations.
Power on load
Protected Areas Electronics
TID (Gy)
1MeV(cm-2)
2
2e10
4
4e10
6e10
6
8e10
8
1e11
10
1.2e11
1.4e11
Power on load
Protected Areas Electronics
TID (Gy)
1MeV(cm-2)
2
2e10
4
4e10
6e10
5
7.3e10
6
8
1e11
10
1.2e11
1.4e11
Protected Areas Electronics
1. AC Heater Actuators
Failing Component
FPGA
Set point
Solid State Relay
Mains
Protected Areas Electronics
1. AC Heater Actuators
Failing Component
FPGA
Set point
Solid State Relay
Mains
Protected Areas Electronics
2. Insulated Temperature Conditioners Overview (I)
o Cumulative effects failures:
TID (Gy)
NIEL (n/ cm2)
LHC years
in the worst case
70
2e12
4
-> Failing component: DC-DC converter; plans for tests in dedicated test facilities.
o Same results for 12 channels and reproduced in two different CNGS locations.
Protected Areas Electronics
Current Consumption (A)
2
TID (Gy)
70
Protected Areas Electronics
2. Insulated Temperature Conditioners Overview (2)
o Single Event Upsets:
Cross Section (/cm2)
LHC SEU/ hr in the worst case
2e-9
6
-> Failing component: Digital Isolator
->-> Mitigation Technique for LHC: soft reset automatically forced by the control system;
No influence on proper operation of the machine.
o Same results for 12 channels and reproduced in two different CNGS locations.
Protected Areas Electronics
2. Insulated Temperature Conditioners
SEE occurrence
PT
100
4 wire
measurement
ASIC
Digital
Isolation
Amplifier
Analog Isolation
Amplifier
ctrl signal
measurement
FPGA
• measurement
• ctrl signals
………………………..
= Sensor Resistance
Protected Areas Electronics
2. Insulated Temperature Conditioners
SEE occurrence
50
Ω
1
100μA
ASIC
5mV
Digital
Isolation
Amplifier
Analog Isolation
Amplifier
1
FPGA
5mV
• 5mV
• 100μA
......................
= 50 Ω
Protected Areas Electronics
2. Insulated Temperature Conditioners
SEE occurrence
50
Ω
01
10μA
100μA
ASIC
0,5mV
5mV
Digital
Isolation
Amplifier
Analog Isolation
Amplifier
1
FPGA
0,5mV
5mV
• 0,5mV
• 100μA
......................
=5Ω
o
A soft remote Reset brings the situation back to normal.
o
Cross section calculation:
Tunnel Electronics Overview
o Tunnel electronics have received till now a cumulated dose of:
TID (Gy)
~125
NIEL (n/ cm2)
~4e12
LHC years
in 90% of the cases
..and the tests are still ongoing!
o No Single Event Errors!
o Still within specs in output accuracy!
>10
Tunnel Electronics
51
Resistance (Ω)
50
48
TID (Gy)
Tunnel Electronics
Design Specs
+0.3%
51
Resistance (Ω)
-0.3%
50
48
0TID (Gy)
10
20
40
60
80
100
120
Tunnel Electronics Overview
o Tunnel electronics have received till now a cumulated dose of:
TID (Gy)
~125
NIEL (n/ cm2)
4e12
LHC years
>10
in 90% of the cases
..and the tests are still ongoing!
o No SEE!
o Still within specs in output accuracy!
o BUT! Gain drifts already observed and corrected by auto calibration features.
Reference Voltage
Sensor Voltage
Tunnel Electronics
Vsens = G*I*Rsens
Vref = G*I*Rref
Reference Voltage
Sensor Voltage
Tunnel Electronics
Vsens = G*I*Rsens
Vref = G*I*Rref
51
50
Reference Voltage
Sensor Voltage
Tunnel Electronics
48
Vsens = G*I*Rsens
Vsen
Rsens=Rref
Vref
Vref = G*I*Rref
Outline
o Overview of the Cryogenic Instrumentation Electronics
o Radiation tolerance strategy
o CNGS Test Facility
o Test Setup
o Test Results
o Conclusions
Conclusions
o CNGS testing has provided quantitative knowledge about the
radiation tolerance of our complete system.
o Confirmation of LHC tunnel electronics reliability.
o Identification of protected areas electronics weaknesses.
o First approach of possible solutions.
Conclusions
o CNGS testing has provided valuable knowledge for all our electronics
o Further tests on specific components need to be performed
oThank you for your attention
o Optimism in the case of tunnel electronics
o Multiple solutions for the protected areas electronics problems
Conclusions
o CNGS testing has provided valuable knowledge for all our electronics
o Further tests on specific components need to be performed
oThank you for your attention
o Optimism in the case of tunnel electronics
o Multiple solutions for the protected areas electronics problems
TWEPP Paris, 09
Extras
Voltage & Current Measurements
o
In order to probe and gain access to the Current Consumption and Voltage Level signals,
modification needed to be done on the Power Supply Card
•
•
The Power Supply Card receives the mains and provides channels of DC Voltage for all
the Cards in a Crate
A 1Ω robust resistance inserted in series in the tracks of the Power Card
V
I
1Ω
Voltage & Current Measurements
o
In order to probe and gain access to the Current Consumption and Voltage Level signals,
modification needed to be done on the Power Supply Card
•
•
The Power Supply Card receives the mains and provides channels of DC Voltage for all
the Cards in a Crate
A 1Ω robust resistance inserted in series in the tracks of the Power Card
V
I
1Ω
Cryogenic Instrumentation Conditioner Channels
Architecture
Pressure
Sensor
ASIC
ADC
ADC
FPGA
FPGA
FPGA
MUX
PT
100
ASIC
ADC
MUX
MUX
Pressure
Sensor
ASIC
SRAM
FPGA
WorldFIP
AGENT
WFIP Communication Card
(holds up to 7 Cards)
Conditioner Card (holds 2 independent channels)
WorldFIP FIELDBUS
High Accuracy main features
o
Auto-calibrated System: high precision resistor measured every time a variable measurement is
taken and correction of amplifier offset by amplifier input inversion as well as correction of cable
TC effects by current inversion.
Cryogenic Instrumentation Conditioner Channels
Architecture
Pressure
Sensor
ASIC
ADC
ADC
FPGA
FPGA
FPGA V = G*I*R
sens
sens
MUX
PT
100
ASIC
ADC
MUX
MUX
Pressure
Sensor
ASIC
SRAM
FPGA
WorldFIP
AGENT
WFIP Communication Card
(holds up to 7 Cards)
Conditioner Card (holds 2 independent channels)
ASIC
WorldFIP FIELDBUS
o
High Accuracy main features
highprecision
precision
resistor
Auto-calibrated System: high
resistor
measured every time a variable measurement is
taken and correction of amplifier offset by amplifier input inversion as well as correction of cable
TC effects by current inversion.
Cryogenic Instrumentation Conditioner Channels
Architecture
Pressure
Sensor
ASIC
ADC
FPGA
FPGA
FPGA Vsens = G*I*Rsens
Vref = G*I*Rref
MUX
PT
100
ASIC
ADC
MUX
MUX
Pressure
Sensor
ASIC
SRAM
FPGA
WorldFIP
AGENT
WFIP Communication Card
(holds up to 7 Cards)
Conditioner Card (holds 2 independent channels)
ASIC
WorldFIP FIELDBUS
o
High Accuracy main features
highprecision
precision
resistor
Auto-calibrated System: high
resistor
measured every time a variable measurement is
taken and correction of amplifier offset by amplifier input inversion as well as correction of cable
TC effects by current inversion.
Cryogenic Instrumentation Conditioner Channels
Architecture
Pressure
Sensor
ASIC
ADC
FPGA
FPGA
FPGA
+
V
sens
= Voff + G*I*Rsen
MUX
PT
100
ASIC
ADC
MUX
MUX
Pressure
Sensor
ASIC
SRAM
FPGA
WorldFIP
AGENT
WFIP Communication Card
(holds up to 7 Cards)
Conditioner Card (holds 2 independent channels)
ASIC
WorldFIP FIELDBUS
High Accuracy main features
o
Auto-calibrated System: high precision resistor measured every time a variable measurement is
input
inversion
taken and correction of amplifier offset byamplifier
amplifier input
inversion
as well as correction of cable
TC effects by current inversion.
Cryogenic Instrumentation Conditioner Channels
Architecture
Pressure
Sensor
ASIC
ADC
FPGA
FPGA
FPGA
V+sens = Voff + G*I*Rsen
V-
= Voff + G*I*Rsen
MUX
PT
100
ASIC
ADC
MUX
MUX
Pressure
Sensor
ASIC
SRAM
FPGA
WorldFIP
AGENT
WFIP Communication Card
(holds up to 7 Cards)
sens
Conditioner Card (holds 2 independent channels)
ASIC
WorldFIP FIELDBUS
High Accuracy main features
o
Auto-calibrated System: high precision resistor measured every time a variable measurement is
input
inversion
taken and correction of amplifier offset byamplifier
amplifier input
inversion
as well as correction of cable
TC effects by current inversion.
Cryogenic Instrumentation Conditioner Channels
Architecture
Pressure
Sensor
ASIC
PT
100
-
ASIC
ADC
FPGA
FPGA
VI+sens = G * (I*Rsens +VTC)
VI-
= G * (-I*Rsens +VTC)
MUX
+
ASIC
FPGA
MUX
MUX
Pressure
Sensor
ADC
SRAM
FPGA
WorldFIP
AGENT
WFIP Communication Card
(holds up to 7 Cards)
sens
Conditioner Card (holds 2 independent channels)
VTC
ASIC
WorldFIP FIELDBUS
High Accuracy main features
o
Auto-calibrated System: high precision resistor measured every time a variable measurement is
taken and correction of amplifier offset by amplifier input inversion as well as correction of cable
TC effects
by current inversion.
TC
effects