Transcript civinini

The CMS Silicon Strip Tracker
Carlo Civinini
INFN-Firenze
On behalf of the CMS Tracker Collaboration
Sixth International "Hiroshima" Symposium on the
Development and Application of
Semiconductor Tracking Detectors
Carmel Mission Inn, California
September 11-15, 2006
Pixel Detector
Inner
Barrel
(TIB)
The
CMS
1.2 m
Silicon
Tracker
Inner Disks
(TID)
2.7 m
Outer Barrel (TOB)
End Caps (TEC)
•4 layers in TIB
•6 disks in TID
•6 layers in TOB
S. Mersi
•18 disks in TEC
Silicon Strip Modules
• TIB Module
Front-End Hybrid
APV and control chips
29 different Module Flavours
Kapton tails
Pitch Adapter
Kapton Bias Circuit
All single sided sensors  double sided detectors
Carbon
Fiber/Graphite
Frame
are realized gluing
back
to back two
single Silicon
sidedSensors
modules
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Sensors
• p on n
• 6” wafers
• Inner region: low resistivity
1.5-3.5 kWcm, thin 320 mm
• Outer region: higher
resistivity 3.5-7.5 kWcm,
thick 500 mm
• Polysilicon resistor
Biasing
• AC-coupled Al readout
strips
• <100> Si orientation
• Metal overhang on
implant strips
• Single sided
This room is 180 m2
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6.136 Thin wafers  6.136 Thin
detectors (1 sensor)
18.192 Thick wafers  9.096 Thick
detectors (2 sensors)
More than 200 m2 of Silicon Surface
16 Sensor Designs
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Front-end Electronics
12 hybrid designs
9.648.128 Strips  electronics
channels
PLL75.376 APV chips
26.000.000 Bonds
37 000 analog optical links
MUX
3000 km optical fibres
APV25
Kapton Multilayer
Hybrid circuit
DCU
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Front-end Electronics
• APV25
• Radiation tolerant 0.25 mm CMOS technology
• Charge sensitive amplifier with t=50 ns, CR-RC shaper, 192
cell pipeline (4.8 ms deep) per channel
• 128 channels multiplexed to 1 analog output
• Operation modes: Peak mode (1 sample, t=50 ns);
Deconvolution mode (weighted sum of 3
samples, t=25 ns)  High Luminosity
• MUX
• 2 APV25 chips outputs onto a single differential line
• PLL
• Decodes clock & trigger signals + delay adjusts
• DCU
• Slow control data 12 bit ADC (onboard temperatures, leakage
current, low voltages)
• AOH
• Analog opto-hybrid, converts the front-end analog output
current to laser light
• All functional parameters of these devices can be
down/uploaded by mean
of I2C bus
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Module Test
• The 15232 (+spares) produced modules
have been tested to spot possible problems
and each strip has been characterized in
term of noise, short, open, pinhole etc…
• Information about module quality has been
stored in a production database
• A large fraction of production has been
also thermally stressed before integration
on the mechanical structures
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Module Test
opens
noisy
TOB noise distribution for 4-chip and 6-chip modules
400V bias (30% production)
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C. Marchettini
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Module Production Summary
Modules
produced
Good after Bad*
assembly*
% good
TIB/TID
3945
3810
135
97%
TOB
5434
5348
86
98%
TEC
7228
6761
467
94%
Total
16607
15919
688
96%
M. Krammer
Percentage of bad strips on good modules at level of
0.05% - 0.1%
* Sept. 4st 2006 (Includes also module repair)
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TIB Integration
… how to assemble a piece of Tracker
(16 half shells)
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TIB Integration
•
•
•
•
Mechanical structure (with cooling
pipes and precision ledges)
Mount Analog OptoHybrids and Mother
Cables
Modules installation
Tests
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Mechanical Structure
Temporary fibre
Holders
Carbon fibre
Structural part
PT1000
Temperature
Probes
Cooling pipes
Half shell of half barrel
Cooling precisionTIB+ or TIBLedges
Depending on the side of the interaction point
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AOH and MC Mounting
Mother Cable:
Kapton circuit which provides2 Modules
withpigtail
power,optical fibres
meters long
clock, trigger and I2C data
Analog Optical
Hybrid
Analog electrical signals from the module
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Modules
•
•
•
•
Each module has been mounted by hand on the
mechanical structure
Double sided modules, because of their complexity, need
a simple mechanical tool to guide the operator’s hand
The precision is anyway defined by the mechanics, no
loss of precision or reproducibility in this operation
Very rare accidents because of handling…
Precision Insert
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Precision Insert
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Tests
• After each single module has been
mounted a fast connectivity test is
done (I2C bus scan, module identity
check)
• When a string of modules (3) is
mounted a deep test is performed:
readout timing and optoelectronics
optimization then pedestals and noise
@ 400V bias
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Cumulative noise
Layer 4
Backward up
noise
Distribution
Deconvolution
400V bias
2.1 is the cut used
During module production
Test to flag a noisy strip
Opens (0.03%)
ADC Counts
C. Genta
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Full of modules…
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Burn in
• All TIB half shells and TID disks were
checked for possible weak components fail
and for temperatures and noise behaviour
• A structure is fully powered and readout
during this test.
• Runs are taken both at room temperature
and at cold (C6F14 @ -25oC and sensors @
-15oC), peak and deconvolution mode
• Same sequence as integration: timing and
optogain optimization then pedestals and
noise run
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Burn-in Noise
Noise distribution at
Burn-in of Layer4
backward up
Deconvolution
400V Bias
A. Venturi
M. Vos
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ADC counts
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The TIB half shells
are coupled
together and then
inserted one
into the other
(4,3,2,1 sequence)
to form the barrel
Building the TIB+
T. Lomtadze
& A. Basti
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TIB+
Seen from
the interaction
point
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R. Dell’Orso
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Conclusions
• The CMS Silicon Strip Tracker Collaboration has
finished the components production
– O(105) complex objects (modules, electronics boards,
mechanical parts, cables, fibres, etc.) tested
• The integration phase is now well advanced (an
O(105) pieces puzzle) and the different subdetectors (TIB/TID, TOB, TEC) will be joined
together in the coming months
• Then commissioning and finally Physics…
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