Transcript Beam lines at SSRL, C. Condron

Beam Lines At SSRL
Cathie Condron
SSRL Scattering Workshop
May 2007
Materials Scattering Beam Lines
Characteristics
Diffractometer
Flux
Energy range
Detectors
Analyzers
Sample stages
Used for
Planning Experiments at SSRL
1-4 SAXS
Q range
0.0001 – 1 Å
Scatter From
1-100 nm density inhomogeneities
Energy Range
8333 eV Detector
CCD
Sample Stages
Transmission
Flow Cell
Heater (R.T. ~ 200 °C)
Reflection
1-4 SAXS
Use full to look at
nanoparticles (catalysts, bio-oxides, geo-oxides)
nanoporous materials
co-polymers
dendimers
supramolecular assemblies
Micelles
colloids
metallic glasses
WAXS
patterns contain data concerning
correlations on an intra-molecular,
inter-atomic level
SAXS
patterns contain data concerning
correlations on an inter-molecular
level
2-1: Powder/ Thin Film Diffraction
Diffractometer
Huber 2-circle: q (sample), 2q (detector)
Flux
~1011 to 1012 photons/s
Energy Range
4000 eV to 15800 eV
Detector
Bicron (scintillation, no E resolution)
Vortex (future, ~100 eV E resolution)
2q
Analyzers
Crystal (high-resolution)
Sollar (low resolution)
Slits (adjustable/ lowish)
Sample Stages
Flat Plate
Capillary (hard to use)
Transmission cell (John Bargar)
Anton Paar Heater (R.T. – 1173 K)
ARS Cryostat (10 K – 350 K)
q
q
* Motorized Sample Stage coming soon
2-1
powder Diffraction, Amorphous Materials, Reflectivity, Thin films, Anomalous diffraction, Specular
Specular Diffraction of Pentacene Thin films: How The
Structure Changes with Film Thickness
7-2: X-ray Scattering and Diffraction
Diffractometer
Huber 4-circle: q (sample), 2q (detector), c, j
Flux
~ 1010
Energy Range
5000 eV to 17500 eV
Detector
Bicron
Vortex
2q
Analyzers
Crystal (high-resolution)
Sollar (low resolution)
Slits (adjustable/ lowish)
Sample Stages
Flat Plate (vacuum chuck)
Anton Paar Heater (R.T. – 1173 K)
ARS Cryostat (10 K – 350 K)
q
j
c
7-2
Single crystals, Grazing-incidence, Anomalous diffraction, Thin films, Surface studies
Polythiophene Thin Film Transistors: Highly Oriented Crystals at
The Interface
Grazing-Incidence
Rocking Curve
Kline et all. Nature Materials, 5, 222, 2006
11-3: X-ray Scattering and Diffraction
Diffractometer
Huber kappa-geometry (θ, k, φ, 2θ)
Flux
2.6 x 1010 ph/s
Energy Range
Fixed at 12700 eV (Se edge)
Detector
Area detector (usually a MAR345)
k, θ and 2θ Fixed
Sample Stages
Flat Plate
Capillary
Flat plate transmission
and other specialized user-designed stages
φ
11-3
Texture, Real time experiments, Polycrystalline, Small grains (e.g. soils), Thin films,
Grazing-incidence
t=0
t=7
t=8
t=9
t=10
Planning an SSRL Experiment
Work with scientific staff before arrival to SSRL
Think about the information you want
Peak shape
Peak position
Variation of peak with q
How long will you need to count
Temperature dependence
Sample environment
Determine Appropriate
Beam line
Energy
Detector
Analyzer
Sample holder
Special equipment
If you are not familiar with the instrument you will be using plan to sit in with
another team if at all possible