Transcript Title/Investigator - University of North Texas

Nanophotonics Laboratory
Arup Neogi
Nanoscale photonic material
and devices characterization
facilities at UNT includes:
• Photoluminescence (PL)
measurement including UVVIS-NIR wavelength regime
• Pico-nanosecond timeresolved PL spectroscopy
using Hamamatsu Streak
Camera
• UV-VIS Raman spectroscopy
for strain estimation in
semiconductor nanostructures
• Characterization of UV-visible
laser diodes, strain
measurement of IR materials
Time resolved PL of
GaN quantum dots
UNT Physics
Near-field Optical Microscopy
• Capability to image
nanoscale optoelectronic
structures (~ 30 nm) using
Nanonics Cryogenic nearfield optical microscope
(4 K – 300 K)
• Tunable ultrafast light
source ranging from 250
nm –12 mm for near-field
luminescence
spectroscopy of light
emitting nanoparticles
Near-field PL spectrum of
a 2 nm single GaN/AlN
quantum dot emitting at
3.37 eV (scan area 450
sq. nm)
UNT Physics