Transcript RIFLE: a Research Instrument for FLash Evaluation

RIFLE: a Research Instrument
for FLash Evaluation
Active Technologies
DEMO
This file contains a demo of RIFLE’s use
RIFLE’s hardware features, software structure,
and performances are shown in the Rifle
presentation file
This demo has been designed for Office 2002,
but it may run quite well under Office 2000
Active Technologies - RIFLE demo - October 2003
Index
Select the section to visit by clicking on the section name
• DUT parameters and constrains definitions
• Standard measurements execution
• Waveform generation, program/erase
( 1 min. 30”)
( 8 min 15”)
( 3 min 50”)
• Preparation and execution of customized cycles
• Post-cycle data analysis
( 3 min.)
• End of presentation
Active Technologies - RIFLE demo - October 2003
( 4 min. 45”)
Selecting a DUT
When RIFLE is started, the user can
select among already installed DUT,
or modify an already installed DUT,
or create a new DUT
Active Technologies - RIFLE demo - October 2003
DUT parameter and constrains
definition
DUT parameters, organization, structure,
constrains, allowed measurements must
be defined just once
They can be modified at any time
Active Technologies - RIFLE demo - October 2003
DUT parameter and constrains
definition
All RIFLEs’ functions may be executed on specific
working areas defined by the user
The working area meaning and limits are strictly
related to the device architecture and organization
Active Technologies - RIFLE demo - October 2003
DUT parameter and constrains
definition
Voltage constrains and specific
enables are set for any cell terminal
Active Technologies - RIFLE demo - October 2003
DUT parameter and constrains
definition
Constrains for PMU (Precise
Measuring Unit) and power
supply are also here defined
Active Technologies - RIFLE demo - October 2003
DUT parameter and constrains
definition
Among the available RIFLE functions,
the user can select the ones to be
activated for the specific DUT…
Active Technologies - RIFLE demo - October 2003
DUT parameter and constrains
definition
… as well as specific function parameters …
Active Technologies - RIFLE demo - October 2003
DUT parameter and constrains
definition
… or working areas properties …
Active Technologies - RIFLE demo - October 2003
DUT parameter and constrains
definition
… and post-analysis functions to be
executed after cycling
Active Technologies - RIFLE demo - October 2003
End of Section
Make your choice by using the PC mouse
Index page
End of presentation
Active Technologies - RIFLE demo - October 2003
Executing standard measurements
Any measurement can be set up and launched in a
completely graphical environment developed under
the National Instruments LabVIEW platform
Active Technologies - RIFLE demo - October 2003
Executing standard measurements
By means of a navigator window it is possible to
set up the parameters for any measurement
(program, erase, IV measures, distributions and
maps, stresses, ..), to browse among 2D and 3D
maps and distributions of threshold voltages or
current gains, 2D and 3D I-V characteristics
Active Technologies - RIFLE demo - October 2003
Executing standard measurements
For any measurement type specific
working areas can be defined
User defined combinations of working
areas will be activated at run-time
Active Technologies - RIFLE demo - October 2003
Parameters setting
•
For any measurement, the appropriate
setting can be chosen by the user or
loaded from the PC memory
• Setting can also be saved for further
applications or saved as new default
• For example, for a threshold distribution…
Active Technologies - RIFLE demo - October 2003
Parameters setting
The user can select the working areas
where a distribution is to be calculated
Active Technologies - RIFLE demo - October 2003
Parameters setting
Initial, final voltage and voltage
step can be chosen by the user
Active Technologies - RIFLE demo - October 2003
Parameters setting
Additional options can be defined
when implementing the DUT driver
(for example, calculate the threshold
distribution on selected pads)
Active Technologies - RIFLE demo - October 2003
Parameters setting
Distribution settings can be loaded
from the PC memory, saved for further
applications or saved as new default
Active Technologies - RIFLE demo - October 2003
Threshold distributions
Threshold distributions can be easily calculated
They are plotted just at the end of the measure
Active Technologies - RIFLE demo - October 2003
Threshold distributions
Statistical information are immediately available:
• distribution width
• distribution mean value
• distribution standard deviation
• total number of cell within the range
• number of cells out of range
Active Technologies - RIFLE demo - October 2003
Threshold distributions
Also for all the other measurement types
(maps, IV characteristics, identification of
set of cells, …) the results can be loaded or
saved
Distributions can also be loaded,
saved, or saved as ASCII file for
further analysis
Active Technologies - RIFLE demo - October 2003
Threshold distributions
Several distributions can be
plotted simultaneously
Active Technologies - RIFLE demo - October 2003
Threshold distributions
Distributions can be plotted
in linear …
Active Technologies - RIFLE demo - October 2003
Threshold distributions
… or in log scale
Active Technologies - RIFLE demo - October 2003
Threshold distributions
as cumulative distributions…
Active Technologies - RIFLE demo - October 2003
Threshold distributions
… or log-normal distributions
Active Technologies - RIFLE demo - October 2003
Threshold maps
Threshold maps can be calculated
on selected working areas and
immediately plotted
Active Technologies - RIFLE demo - October 2003
Threshold maps
All LabVIEW graphic potentialities
can be used for zoom, change of
scale, …
Active Technologies - RIFLE demo - October 2003
Threshold maps
Information (address
and threshold range)
of the cell at red
cursor are immediately
available
Active Technologies - RIFLE demo - October 2003
Threshold maps
Red cursor can be moved by the PC
mouse or forced in a cell location by
entering its coordinates
Active Technologies - RIFLE demo - October 2003
Threshold maps
The two yellow cursors can be used to
select an area for a 3D representation
Active Technologies - RIFLE demo - October 2003
Threshold maps
Yellow cursors can be moved by the
PC mouse or forced in two cell
locations by entering their coordinates
Active Technologies - RIFLE demo - October 2003
Threshold maps
A 3D zoom can be simply
performed at a mouse click
Active Technologies - RIFLE demo - October 2003
Threshold maps
The 3D representation can also be
plotted in the main graphic area
Active Technologies - RIFLE demo - October 2003
Threshold maps
All LabVIEW graphic potentialities
can be used for graph rotation,
change of scale,…
Active Technologies - RIFLE demo - October 2003
Identification of set of cells
Cells satisfying specific criteria
can be immediately identified in
a user-selected working area
Active Technologies - RIFLE demo - October 2003
Identification of set of cells
Preinstalled criteria are:
• N cells with the lowest or highest threshold
• N cells at a specified threshold
• Cells below or above a specified threshold
• Cells in a specified threshold range
• N random cells (to be used as a reference set)
Active Technologies - RIFLE demo - October 2003
Identification of set of cells
Addresses and thresholds of
the cells satisfying the selected
criterion are listed and their
physical location is shown
Active Technologies - RIFLE demo - October 2003
Identification of set of cells
By clicking on a list row, the
physical position of the
selected cell is shown
Active Technologies - RIFLE demo - October 2003
IV characteristics
2D and 3D characteristics can be
measured for any matrix or reference cell
Gate voltages and drain voltages (for 3D
characteristics) are chosen by the user
Cell address is also selected by the user
Active Technologies - RIFLE demo - October 2003
2D IV characteristic
Several characteristics can
be plotted simultaneously
Active Technologies - RIFLE demo - October 2003
3D IV characteristic
All LabVIEW graphic potentialities
can be used for graph rotation,
change of scale,…
Active Technologies - RIFLE demo - October 2003
Single cell threshold calculation
The threshold voltage of any user-selected
cell can be immediately calculated
Threshold voltage is calculated as the gate
voltage corresponding to a user-defined
drain current
Active Technologies - RIFLE demo - October 2003
Single cell threshold calculation
Active Technologies - RIFLE demo - October 2003
Current and Gain measurements
All measurements shown for threshold
voltages
(distributions,
maps,
single
cell,…) can be performed for current and
current gain
Active Technologies - RIFLE demo - October 2003
Drain and Gate stresses
Drain stress and gate stress can be easily activated
For example, for a drain stress…
Active Technologies - RIFLE demo - October 2003
Drain and Gate stresses
for the selected working area,
drain voltage and stress duration
can be chosen by the user
Active Technologies - RIFLE demo - October 2003
Drain and Gate stresses
Additional options can be defined
when implementing the DUT driver
Active Technologies - RIFLE demo - October 2003
End of Section
Make your choice by using the PC mouse
Index page
End of presentation
Active Technologies - RIFLE demo - October 2003
Waveform editing
For test chips and for many commercial DUT used in
test mode, it is important to evaluate the impact on
performance and reliability of different waveforms
applied during writing operations
RIFLE allows editing fully arbitrary waveforms
The waveforms will be applied to the device as they
are edited
Active Technologies - RIFLE demo - October 2003
Waveform editing
Users can select the pulse to edit, to load or to save
Pulses can also be saved as default pulses
Active Technologies - RIFLE demo - October 2003
Waveform editing
All pulses can be loaded or saved
together
Active Technologies - RIFLE demo - October 2003
Waveform editing
A waveform is formed by many parts
Each part can be edited separately
Each part can have a linear shape, or exponential,
gaussian, sinusoidal, logarithmic shape
Active Technologies - RIFLE demo - October 2003
Waveform editing
For each part, the initial and final voltages, the
time duration and its shape must be chosen
Active Technologies - RIFLE demo - October 2003
Waveform editing
Any set of parts can be repeated…
Active Technologies - RIFLE demo - October 2003
Waveform editing
Any set of parts can be repeated…
Active Technologies - RIFLE demo - October 2003
Waveform editing
Any single part of the repetition can be edited
Active Technologies - RIFLE demo - October 2003
Programming
For programming, several options are available
Other advanced options can be implemented when
writing the DUT driver
Waveforms to be applied for programming can be
edited as previously shown
Active Technologies - RIFLE demo - October 2003
Programming
The maximum number of
programming pulses and the
threshold
voltage
for
program verify (if activated)
can be entered by the user
Active Technologies - RIFLE demo - October 2003
Programming
Pulses with increasing (or
decreasing) voltages can be
applied
In that case, the first pulse is
the edited one, and the
voltage step must be entered
Active Technologies - RIFLE demo - October 2003
Programming
Several
options
can
be
chosen as program report
For
example,
the
total
number
of
pulses
and
information on failed cells
Active Technologies - RIFLE demo - October 2003
Programming
A current probe can be
connected to any waveform
generator, to show its
current as in an oscilloscope
Probe characteristics can be
set by the user
Active Technologies - RIFLE demo - October 2003
Programming
Specific options can be
added for the DUT…
Active Technologies - RIFLE demo - October 2003
Programming
for example, verify options, current
reference, programming parallelism,
pad selection
Active Technologies - RIFLE demo - October 2003
Programming
Fail/No
fail
information
are
immediately shown at the end of
programming
Other
information
such
as
programming time, total number of
pulses, number of failed cells (if any)
are also shown
Active Technologies - RIFLE demo - October 2003
Programming
In case of failure, the location of
unprogrammed cells is shown
Active Technologies - RIFLE demo - October 2003
Programming
If the current probe is enabled,
the current absorbed by the
selected generator is plotted
Active Technologies - RIFLE demo - October 2003
Erasing
Erasing is performed exactly as programming
Several advanced options can be activated when creating
the DUT driver
Active Technologies - RIFLE demo - October 2003
Erasing
For example, bulk or source erase
Active Technologies - RIFLE demo - October 2003
End of Section
Make your choice by using the PC mouse
Index page
End of presentation
Active Technologies - RIFLE demo - October 2003
Cycling
The basic operations implemented for the
DUT can be combined to create complex
automated measurement cycles
Active Technologies - RIFLE demo - October 2003
Cycling
By means of the navigator window, it is possible
to edit a cycle, to select the data analysis to be
performed and to start a cycle
Active Technologies - RIFLE demo - October 2003
Cycling
Creating a new cycle or editing an already saved
cycle requires basic knowledge of the National
Instruments LabVIEW software
Active Technologies - RIFLE demo - October 2003
Cycling
Icons representing particular basic operations
have been created and placed in the RIFLE
icon of the LabVIEW function palette
Active Technologies - RIFLE demo - October 2003
Cycling
For example….
Calculate a threshold distribution
Active Technologies - RIFLE demo - October 2003
Cycling
Calculate a gain distribution
Active Technologies - RIFLE demo - October 2003
Cycling
Calculate a threshold map
Active Technologies - RIFLE demo - October 2003
Cycling
Threshold distribution & map
Active Technologies - RIFLE demo - October 2003
Cycling
Erase
Active Technologies - RIFLE demo - October 2003
Cycling
Cycle (Program/erase)
Active Technologies - RIFLE demo - October 2003
Cycling
Identify a subset of cells
Active Technologies - RIFLE demo - October 2003
Cycling
Gate stress
Active Technologies - RIFLE demo - October 2003
Creating a new cycle
A cycle is simply created by picking objects
representing a particular operation from
the icons’ palette and placing and linking
them together to form a block diagram
Active Technologies - RIFLE demo - October 2003
Creating a new cycle
The following example will be created:
1.
Calculation of the threshold distribution for a working area
2.
Identification of the 100 cells with the lowest threshold
3.
Cells belonging to the working area are than cycled
(program + erase) for 1000 times
4.
At the end of each erasing operation, the thresholds of the
previously marked cells are calculated and saved
5.
At the end of the cycle, a new threshold distribution is
calculated
Active Technologies - RIFLE demo - October 2003
Creating a new cycle
The icon representing the threshold
distribution is picked from the palette
and placed in a .vi diagram
Active Technologies - RIFLE demo - October 2003
Creating a new cycle
The parameters for the threshold
distribution are entered by the user
Standard LabVIEW syntax is used
Results are automatically saved
Active Technologies - RIFLE demo - October 2003
Creating a new cycle
The icon representing the identification
of set of cells is picked from the toolbar
and added in the .vi diagram
Active Technologies - RIFLE demo - October 2003
Creating a new cycle
The parameters for the subset
identification are entered by the user
Active Technologies - RIFLE demo - October 2003
Creating a new cycle
Also the file name where addresses
and thresholds are to be saved is
entered by the user
Active Technologies - RIFLE demo - October 2003
Creating a new cycle
The complete .vi diagram
is here shown
Active Technologies - RIFLE demo - October 2003
Creating a new cycle
Icons identifying program-erase
cycles and follow identified cells…
Active Technologies - RIFLE demo - October 2003
Creating a new cycle
…are inserted in a cycle to
be repeated 1000 times
Active Technologies - RIFLE demo - October 2003
Creating a new cycle
Finally, an icon for threshold
distribution is placed. The same
parameters applied to the first
distribution are here considered
Active Technologies - RIFLE demo - October 2003
Creating a new cycle
When the editing phase is terminated, the entire
cycle is saved with a name chosen by the user
Already saved cycles can be edited and saved
with different names
Active Technologies - RIFLE demo - October 2003
Running a cycle
The selected cycle
can be easily started
Active Technologies - RIFLE demo - October 2003
Running a cycle
Cycle duration is estimated
before execution. The red
bar gives an idea of the
elapsed and remaining times
Active Technologies - RIFLE demo - October 2003
Running a cycle
End of cycle can be notified
to the user by means of an
E-mail or a SMS
Active Technologies - RIFLE demo - October 2003
Results saving
Results are saved in a directory
with the same name of the cycle
Subdirectories are automatically
created, one for any measurement
type
Active Technologies - RIFLE demo - October 2003
Results saving
When several threshold
distributions (or maps) are
calculated,
they
are
automatically saved with
progressive names
Specific file names can be
selected
by
the
user
during cycle editing
Active Technologies - RIFLE demo - October 2003
End of Section
Make your choice by using the PC mouse
Index page
End of presentation
Active Technologies - RIFLE demo - October 2003
Post-cycle Data Analysis
Data
analysis
can
be
started by using the same
navigator window used for
standard
measurements
and cycle editing
Active Technologies - RIFLE demo - October 2003
Threshold evolution during cycling
The threshold evolution
of the selected cell is
automatically plotted
Active Technologies - RIFLE demo - October 2003
Threshold evolution during cycling
File name where data are saved
is entered by the user
Data can be analyzed at any time
Active Technologies - RIFLE demo - October 2003
Threshold evolution during cycling
Criteria
used
for
subset
identification are reported for
user convenience
Active Technologies - RIFLE demo - October 2003
Threshold evolution during cycling
Cells can be sorted by different criteria:
Standard deviation
Maximum DV during cycle
Both ascending or descending sorting is
considered
Active Technologies - RIFLE demo - October 2003
Threshold evolution during cycling
For any selected cell,
its address is shown
Active Technologies - RIFLE demo - October 2003
Threshold evolution during cycling
Cumulative information
on the identified set
can be plotted…
Active Technologies - RIFLE demo - October 2003
Threshold evolution during cycling
… the graph of the standard
deviation for any cell of the
identified set of cells is here
shown, sorted in ascending order
Active Technologies - RIFLE demo - October 2003
Location and count maps
Other graph types are available to analyze data on
identified subset of cells
Location maps show the location within the array of the
cells identified during a cycle. When a set is identified
at any cycle, the cell location at each cycle is shown
When sets of cells are identified at any cycle, count
maps show how many times cells have been identified
Active Technologies - RIFLE demo - October 2003
Location map
In this example, the 1000 cells
with the lowest thresholds have
been identified at each cycle
Active Technologies - RIFLE demo - October 2003
The cycle number and the
corresponding location map can
be changed without loading new
data
Location map
The location of all the cells
identified during cycling can be
shown at the same time using
the intersection mode option
Active Technologies - RIFLE demo - October 2003
Count map
Count maps show the location
of all cells identified during
cycling together with their
repetition number
Active Technologies - RIFLE demo - October 2003
Erase/program history
Several information concerning program
and erasing during cycling can be saved
and are immediately available
Active Technologies - RIFLE demo - October 2003
Erase/program history
For example, fail/no fail indication
at each cycle can be plotted
Active Technologies - RIFLE demo - October 2003
Erase/program history
Other more detailed information, as the
number of pulses at each cycle, are available
Active Technologies - RIFLE demo - October 2003
Advanced analysis tool
Other analysis tools are already available
In addition, users can add analysis tools to
be used for specific applications, always
using the standard LabVIEW language
Active Technologies - RIFLE demo - October 2003
End of Section
Make your choice by using the PC mouse
Index page
End of presentation
Active Technologies - RIFLE demo - October 2003
The staff of Active Technologies
thanks you for your kind
attention
www.activetechnologies.it
[email protected]
Active Technologies - RIFLE demo - October 2003