Fault-Tolerant Techniques and Nanoelectronic Devices
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Transcript Fault-Tolerant Techniques and Nanoelectronic Devices
Fault-Tolerant Techniques
and Nanoelectronic Devices
Andy Hill
CH E 5480 995
Abstract
Proposed nanocomputers offer faster,
more powerful computing
Problems expected
– High manufacturing defect rate
– Transient errors
Two possible solutions
– Increase manufacturing efficiency
– Increase device’s capacity for defects
Abstract (cont’d)
Most nanoelectronic device research today
is devoted to reducing the size of devices
Fault-tolerant technique research shows
that the reconfiguration method is:
– Can handle the highest defect rate
– Cannot handle the current defect rate
– May be impractical
Introduction
First computer invented had one function
– to solve linear equations
Always a push to be faster, more powerful
Other technologies would aid
tremendously from more powerful
computers
– Military
– Artificial Intelligence
– Medical / Biological
Literature Review
Fault-tolerant techniques have been
studied for over half a century
Research focused on application of
technique
Current research focused on techniques
for chips with 1012 devices in 1 square cm
Lit Review (cont’d)
Nanoelectronic device research mainly
focused on producing molecular scale
devices
Limited research on the production of
those devices
Theoretical Background
Main fault-tolerant techniques
– Redundancy (RMR, CTMR)
– NAND multiplexing
– Reconfiguration
Redundancy
[1]
R-fold (RMR) redundancy (left) is a function of cascaded triple (CTMR)
redundancy (right)
Multiplexing / Reconfig
NAND multiplexing
– Complex system utilizing majority gates and
NAND logic
– Adaptive to decreasing manufacturing
effficiency
Reconfiguration
– Units not working are detected
– Cluster reconfigured accordingly
Current Research
Research comparing techniques shows
reconfiguration can adapt to highest
defect rates, but may be impractical
[1]
Current research (cont’d)
Nanoelectronic devices being researched
are 100 to 1000 times smaller than
current devices
[2]
Future Directions
Continue research of techniques specific
to nano-scaled devices
– Determine practicality of reconfiguration
Continue research developing
nanoelectronic devices
Research the efficiency of mass producing
devices
References
[1] - K Nikolic, A Sadek and M Forshaw 2002
Fault-tolerant techniques for
nanocomputers Nanotechnology 13 357362
[2] - Goldhaber-Gordon D. et al. 1997
Overview of Nanoelectronic Devices
Proceedings of the IEEE 85 (4)