Transcript Chapter 16

Chapter 16
Introduction to Quality
©
Some Benefits of Utilizing
Statistical Quality Methods
Increased Productivity
Increased Sales
Increased Profits
Causes of Process Variation
Common causes (also called random or uncontrollable
causes) of variation are those causes that are random in
occurrence and are inherent in all processes. Management,
not the workers, are responsible for these causes.
Assignable causes (also called special causes) of variation
are the result of external sources outside the system. These
causes can and must be detected, and corrective action
must be taken to remove them from the process. Failing to
do so will increase variation and lower quality.
Stable Process
A process is stable (in-control) if all assignable
causes are removed; thus, variation results only
from common causes.
Overall Mean, Average Sample
Standard Deviation, Process
Standard Deviation
A sequence of K samples, each of n observations, is taken over time
on a measurable characteristic of the output of a production
process. The sample means denoted Xi for I = 1, 2, . . ., K can be
graphed on an X – chart. The average of these sample means is the
overall mean of the sample observations
K
X   Xi / K
i 1
The sample standard deviations denoted si for 1 = 1, 2, . . . ,K can be
graphed on an s-chart. The average sample standard deviation is
K
s   si / K
i 1
The process standard deviation, , is the standard deviation of the
population from which the samples were drawn, and it must be
estimated from sample data.
Estimate of Process Standard
Deviation Based on s
An estimate of process standard deviation, ̂ is
ˆ  s / c4
Where s is the average sample standard deviation,
and the control chart factor, c4, which depends on the
sample size, n, can be found in Table 16.1 or the
Factors for Control Charts table in the appendix. If
the population distribution is normal, the estimator is
unbiased.
Factors for Control Charts
(Table 16.1)
n
c4
A3
B3
B4
2
.789
2.66
0
3.27
3
.886
1.95
0
2.57
4
.921
1.63
0
2.27
5
.940
1.43
0
2.09
6
.952
1.29
0.03
1.97
7
.959
1.18
0.12
1.88
8
.965
1.10
0.18
1.82
9
.969
1.03
0.24
1.76
10
.973
0.98
0.28
1.72
X - Chart
The X – Chart is a time plot of the sequence of sample means.
For convenience in interpretation, three lines are drawn on this
chart. The center line is
CLX  X
In addition, there are three-standard error control limits. The
lower control limit is
LCLX  X  A3 s
And the upper control limit is
UCLX  X  A3 s
Where certain values of A3 are given in Table 16.1 or the Control
Chart Constants Table in the Appendix.
s - Chart
The s-chart is a time plot of the sequence of sample standard
deviations. The center line on the s-chart is
CL  s
For three-standard error limits, the lower control limit is
LCLs  B3 s
And the upper control limit is
UCLs  B4 s
Where values for the control chart constants B3 and B4 are shown
in Table 16.1.
Out of Control Patterns
Certain patterns of data points in a control chart
indicate that a process might be out-of-control.
Three of these patterns are:
1) A value outside the control limits (One point
more than 3 sigmas from center line);
2) Trend in sample statistics (six points in a row,
all decreasing or increasing);
3) Too many points on one side of the center line
(nine points in a row on same side of center
line)
Two Measures of Process
Capability
Assume that management sets lower (L) and upper (U) tolerance
limits for process performance. Process capability is judged by
the extent to which
liesXbetween
 3̂ these limits.
(i) Capability Index. This measure is appropriate when the
sample data are centered between the tolerance limits, i.e.
X  ( L  U ) / 2. The index is
U L
Cp 
6̂
A satisfactory value of this index is usually taken to be one that
is at least 1.33. [This implies that the natural rate of tolerance of
the process should be no more than 75% of (U – L), the width of
the range of acceptable values.]
Two Measures of Process
Capability
(continued)
(ii) Cpk Index. When the sample data are not centered between
the tolerance limits, it is necessary to allow for the fact that the
process is operating closer to one tolerance limit than the other.
The resulting measure, called the Cpk index, is
U  X X  L 
C pk  Min 
,

3ˆ 
 3ˆ
Again, this is taken to be satisfactory if its value is at least 1.33.
Defects and Defectives
“A defect is a single nonconforming quality
characteristic of an item. An item may have
several defects. The term defective refers to
items having one or more defects”
(reference 4).
Average of Sample Proportions
A sequence of K samples, each of n observations, is
taken over time, and the proportion of sample members
not conforming to standards is determined. These
sample proportions denoted pi for i = 1, 2, . . ., K can be
plotted on a p-chart. If the samples are of the same size,
the average of the sample proportions is the overall
proportion of nonconforming items. This is
K
pi
p
i 1 K
p - Chart
The p-chart is a time plot of the sequence of sample proportions
of nonconforming items with center line given by:
CLp  p
The lower and upper control limits are:
p(1  p)
LCLp  p  3
n
p(1  p)
and UCLp  p  3
n
Sample Mean Number of
Occurrences
A sequence of K samples is inspected over time. For
each item, the number of occurrences of some event,
such as an imperfection, is recorded. These numbers of
occurrences are denoted ci for i = 1, 2, . . ., K. The
sample mean number of occurrences is then
K
ci
c 
i 1 K
c - Chart
The c-chart is a time plot of the number of occurrences of
an event. The center is:
CLc  c
For three-standard error limits, the lower control limit is:
or
LCLc  c  3 c
if c  9
LCLc  0
if c  9
and the upper control limit is
UCLc  c  3 c
Key Words
 Assignable Causes
 c-chart
 Common Causes
 Control Chart Constants
 Cp Index
 Cpk Index
 Defect
 Defective
 Deming, W. Edwards
 Estimate of Process
Standard Deviation
based on s
 Estimate of Process
Standard Deviation
based on R
 Natural Tolerance
 Out-of-Control Patterns
 p-chart
 Process Capability
Indices
 Process Standard
Deviation
 R-chart
 s-chart
Key Words
(continued)
 Specification Limits
 Stable Process
 Taguchi
 X-Chart