Statisztikai folyamatszabályozás
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Transcript Statisztikai folyamatszabályozás
Statistical Process Control
Production and Process
Management
Where to Inspect in the Process
• Raw materials and purchased parts – supplier
certification programs can eliminate the need for
inspection
• Finished goods – for customer satisfaction, quality at the
source can eliminate the need for inspection
• Before a costly operation – not to waste costly labor or
machine time on items that are already defective
• Before an irreversible process – in many cases items
can be reworked up to a certain point, beyond that point
• Before a covering process – painting can mask deffects
Process stability and process
capability
• Statistical process control (SPC) is used to
evaluate process output to decide if a
process is „in control” or if corrective
action is needed.
• Quality Conformance: does the output of
a process conform to specifications
• These are independent
Variation of the process
• Random variation (or chance) – natural variation
in the output of a process, created by countless
minor factors, we can not affect these factors
• Assignable variation – in process output a
variation whose cause can be identified.
• In control processes – contains random
variations
• Out of control processes – contains assigneable
variations
Sampling distribution vs. Process
distribution
• Both distribution have the
same mean
• The variability of the sampling
distribution is less than the
variability of the process
• The sampling distribution is
normal even if the profess
distribution is not normal
• Central limit theorem: states
thet the sample size increase
the distribution of the sample
averages approaches a normal
distribution regardless of the
shape of the sampled
distribution
• In the case of normal
distribution
– 99,74% of the datas fall
into m± 3 σ
– 95,44% of the datas fall
into m± 2 σ
– 68,26% of the datas fall
into m± 1 σ
– If all of the measured datas
fall into the m± 3 σ
intervall, that means, the
process is in control.
Sampling
• Random sampling
– Each itemhas the same probability to be selected
– Most common
– Hard to realise
• Systhematic sampling
– According to time or pieces
• Rational subgoup
– Logically homogeneous
– If variation among different subgroups is not accounted fo, then
an unawanted source of nonrandom variation is being introduced
– Morning and evening measurement in hospitals (body
temperature)
• Variables – generate data that are
measured (continuus scale, for example
length of a part)
• Attributes – generate data that are
counted (number of defective parts,
number of calls per day)
Control limits
• The dividing lines between random and
nonrandom deviation from the mean of the
distribution
• UCL – Upper Control limit
• CL – Central line
• LCL – lower Control limit
• This is counted from the process itself. It is
not the same as specification limits!
Specification limits
• USL – Upper specification limit
• LCL – lower specification limit
• These reflect external specifications, and
determined in advance, it is not counted
from the process.
Control chart
Hypothesis test
• H0 = the process is stable
Decision
Stable
Reality
not stable
Stable
OK
Type I error (risk
of the producer)
not stable
Type II error risk OK
of the costumer)
• Type I error – concluding a process is not in
control when it is actually is – producers risk – it
takes unnecessary burden on the producer who
must searh fot something is not there
• Type II error – concluding a process is in control
when it is actually not – customers risk –
because the producer didn’t realise something is
wrong and passes it on to the costumer
Control charts
x and R – mean and range chart
• Sample size – n=4 or n=5 can be handled
well, with short itervals,
• Sampling freuency – to reflec every affects
as chenges of shifts, operators etc.
• Number of samples – 25 or more
• mean
• range
• n is the sample size
• Means of samples’ means
• Means of ranges
• m is the number of samples
x
x1 x2 ...... xn
n
R xmax xmin
x1 x 2 .... x m
x
m
R
R1 R2 ...... R3
m
Control limits
UCLR D4 R
UCLx x A2 R
LCLR D3 R
LCLx x A2 R
A2, D3, D4 are constants and depends on the sample size
Exercise
6
5
7
day2 8
day3 7
day4 6
6
6
7
6
6
5
7
6
4
8
6
4
2
0
1
2
3
4
day
Means
Cl x-bar
LCL x-bar
UCL x-bar
Rchart
Centimeter
day1 6
centimeter
x-bar chart
6
4
2
0
1
2
3
4
Day
Sample Range
R-bar
UCL R
Control charts for attributes
• When the process charasterictic is
counted rather than measured
• p-chart – fraction of defective items in a
sample
• c-chart – number of defects per unit
p-chart
• p-average fraction
defective in the
population
• P and σ can be counted
from the samples
• min 25 samples – m
• Big samlpe size is
needed (50-200 pieces) –
n
• Number of defective item
–np
• If the LCL is negativ,
lower limit will be 0.
UCLp p z p
LCL p p z p
p
p (1 p )
n
np
p
nm
Exercise
• z=3,00
• p=220/(20*100)=0,11
• σ=(0,11(10,11)/100)1/2=0,03
• UCL=0,11+3*0,03=0,2
• LCL=0,11-3*0,3=0,02
c-chart
• To control the occurrences (defects) per unit
• c1, c2 a number of defects per unit, k is the number of units
UCLc c 3 c
LCLc c 3 c
Exercise
Solution
c
45
2,5
18
UCLc 2,5 3 2,5 7,24
LCLc 2,5 3 2,5 2,24 0
• Determine
Run and trend tests
– Runs up and down (u/d)
– Above and below median (med)
• Count the number of runs and compared with the number of runs
that would be expected in a completely random series.
E (r ) med
N
2 N 1
1 E (r )U / D
2
3
– N number of observations or data points,
– E(r) expected number of runs
•
•
•
•
16 N 29 med N 1
U / D
4
90
Determine the standard deviation
Too few or too maní runs can be an indication of nonrandomness
Determine z score using the following formula:
obs E (r )
z
counted z must be fall into the interval of (-2;2) to accept
nonrandomness (this means that the 95,5% of the time random
process will produce an observed number of runs within 2σ of the
expected number)
It can be (-1,96;1.96) 95% of time
Or (-2,33;2,33) 98% of time
Example
Solution
•
•
•
•
•
•
•
E(r)med=N/2+1=20/2+1=11
E(r)u/d=(2N-1)/3=(2*20-1)/3=13
σmed=[(N-1)/4]1/2=[(20-1)/4]1/2=2,18
σu/d= =[(16N-29)/90]1/2 =[(16*20-29)/90]1/2=1,80
zmed=(10-11)/2,18=-0,46
Zu/d=(17-13)/1,8=2,22
Although the median test doesn’t reveal any
pattern, the up down test does.
Index of process capability
• CP (capability process) – it refers to the inherent variability of
process output relative to the variation allowed by designed
specifications
• the higher CP the best capablity
• I the case of CP>1 the process can fulfill the requirements
• It make sense when the process is centered
USL LSL
Cp
6ˆ
Process capability when process is
not centered
• - estimated process average (using
̂grand mean of the samples)
•
- estimated standard deviation
(USL ˆ )
Cpu
3ˆ
( ˆ LSL)
Cpl
3ˆ
Cpk min{ Cpu; Cpl )
R
ˆ
d2
̂ x
Process capability when process is
not centered II
• When sampling is not achievable, than for
the total population
Pp
(USL LSL)
6
( LSL)
Ppl
3
Ppk min{ Ppu; Ppl}
(USL )
Ppu
3
2
(
x
x
)
i
(n 1)
USL
LSL
Cp=1
Cpk=1
6σ
• When the process is not centered the is the fault
of operator but when standard deviation is
higher than the tolerance limit, managers must
interfer in a new machine is needed ,
Cp>1
Cpk>1
Cpk<1
Cp<1
process capacity is It can’t occure
proper
Process capacity is Managers
not proper it is the responsible for
workers fault
Exercise
• For an overheat projector, the thickness of a
component is specified to be between 30 and
40 millimeters. Thirty samples of components
yielded a grand mean ( x ) 34 mm, with a
standard deviation (̂ ) 3,5 mm. Calculate the
process capability index by following the steps
previously outlined. If the process is not highly
capable, what proportion of product will not
conform?
Solution
USL LSL 40 30
Cp
6ˆ
3 3,5
Cpu
(USL ˆ ) 40 34
0,57
3ˆ
3 3,5
( ˆ LSL) 34 30
Cpl
0,38
3ˆ
3 3,5
• Process is out of control
• To determine number of products use table of
normal distribution
USL x 40 34
zu
1,71
ˆ
3,5
LSL x 30 34
zl
1,14
ˆ
3,5
• 0,1271+0,0436=0,1707 17,07% of products
doesn’t meet specification
Thank you for your attention