Reliability and Safety TCSP Presentation
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Transcript Reliability and Safety TCSP Presentation
(Left to Right)
Matt Finn
Brian Crone
Samuel Oshin
Yonatan Feleke
Future
Cash Register
• The future cash register is a point of sale box
designed to make wireless transactions through
the use of Near Field Communications protocol.
• It will accept payments and send receipts
through NFC. It will also aide the cashier with
orders through voice recognition.
Ability to customize the inventory via the user
interface (Atom)
Ability to communicate with an NFC device
(dSPIC30)
Ability to interface with an IR sensor to detect the
presence of a user (dSPIC30)
Ability to display prompts to user through LCD
(dSPIC30)
Ability to aid cashier by highlighting menu choices
while placing order with voice recognition (Atom)
High
• System irreparable
• Potential for user injury
Medium
• System irreparable
• Little/no potential for user injury
Low
• System still functional
• User inconvenience
Voltage
RS232
Regulator
Level Translator
Microcontroller
NFC
Controller
C1
= .02 (101 to 300 transistors)
πT = 16.0 (<100˚C)
C2 = 0.0012 (3 pins)
π E = 2.0 (Ground fixed environment)
π L = 1.0 ( > 2 years)
π Q = 10.0 (Commercial Grade)
λP
= (C1 x πT + C2 x πE ) x π L x πQ
= 3.224 failures/106 hours
Failure No.
Failure
Mode
Possible
Causes
Failure
Effects
Method of
Detection
Criticality
Voltage Regulator
A1
Output = 0V
Failure of
regulator or
passive
components,
external short
Unable to
operate
Observation,
package
heating up, no
response from
micro to GUI
Medium
A2
Output > 5V
Regulator
Failure
Component
destruction,
Overheating
Observation
High
A3
Output out of
tolerance
Regulator,
Passive
Component
Failure
Operating
voltages
wrong,
unpredictable
Observation,
voltage
probes
Medium
C1
= .02 (101 to 300 transistors)
πT = 7.0 (<85˚C)
C2 = 0.0072 (16 pins)
π E = 2.0 (Ground fixed environment)
π L = 1.0 ( > 2 years)
π Q = 10.0 (Commercial Grade)
λP
= (C1 x πT + C2 x πE ) x π L x πQ
= 1.544 failures/106 hours
Failure No.
Failure
Mode
Possible
Causes
Failure
Effects
Method of
Detection
Criticality
RS232 Translator
B1
Output = 0V
Failure of
translator or
passive
components,
external short
Atom and
Micro unable
to
communicate
Observation,
No messages
from micro
Medium
B2
Output not
translated
MAX3232
Failure
Atom and
Micro unable
to
communicate,
high voltage to
Micro
Observation,
Voltage
probes, no
messages
from micro
Medium
C1
= .28 (16-bit, MOS)
πT = 3.1 (125˚C)
C2 = 0.032 (64 pins)
π E = 2.0 (Ground fixed environment)
π L = 1.0 ( > 2 years)
π Q = 10.0 (Commercial Grade)
λP
= (C1 x πT + C2 x πE ) x π L x πQ
= 9.32 failures/106 hours
Failure No.
Failure
Mode
Possible
Causes
Failure
Effects
Method of
Detection
Criticality
Microcontroller
D1
Output
continuously 0
Software,
Passive
Components,
Short
System not
functional,
blocks not
communicatin
g
Observation,
Software
debugging,
probes
Medium
D2
Output
continuously 1
Software,
Passive
components
Improper
communicatio
n between
blocks, no real
functionality
Observation,
check LEDs
and messages
on GUI
Medium
C1
= .14 (8-bit, MOS)
πT = .96 (85˚C)
C2 = 0.019 (40 pins)
π E = 2.0 (Ground fixed environment)
π L = 1.0 ( > 2 years)
π Q = 10.0 (Commercial Grade)
λP
= (C1 x πT + C2 x πE ) x π L x πQ
= 0.5144 failures/106 hours
Failure No.
Failure
Mode
Possible
Causes
Failure
Effects
Method of
Detection
Criticality
NFC Controller
D1
Output
continuously 0
Oscillator
Failure, Passive
Components,
Short
NFC data will
not be
sent/received.
Payment not
possible
Observation,
correct
payment
information
not received
Low
D2
Incorrect
operating
frequency
Oscillator
failure
Improper data
communicatio
n, potential for
losing data,
incorrect
payment
information
Observation,
Verify
payment
information
with receipt
Low