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InstaVu, DPO,
3rd Gen DPX
1
Agenda
 Evolution
 ART, InstaVu, DPO, 3rd gen DPX
 3rd gen DPX comparison to Xstream and MegaZoom
 Lab: Demonstrate 3rd gen DPX throughput
advantages for troubleshooting, measurements and
tests vs. Xstream and MegaZoom.
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Evolution of Oscilloscopes
Scope
Technology
3
ART
DSO
1950
1980
DPO
1998
Market
Drivers
• Military
• Vacuum tube
technology
• Emerging solid
state technology
• Broadcast video
•
•
•
•
Computers
LSI
Digital data
Mixed signal
environments
• Faster
microprocessor
clock rates
• System integration
• Quality assurance
• Convergence
• Interoperability
• Faster data rates
and microprocessor
clocks
Customer
Challenges
• Device
characterization
• Signal edges and
waveshapes
• Signal data
• High-frequency
effects
• Documentation
• Complex signals
• Standards compliance
• Test equipment
performance
Analog Oscilloscope
 Benefits
 Direct visual impression of actual



signal behavior
Intensity grading (frequency of
occurrence information)
No quantizing error or aliasing
Very fast waveform capture rate
 Shortcomings







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Purely visual information
Blink and miss
Limited bandwidth
performance
Edge triggering
No pre-trigger information
Optimized for single channel
operation
Limited writing speed for low
repetition rate signals
Waveform Capture Rate
Is Limited By Holdoff Time
Transition from ART to DSO
 DSO Cycle
Acquire New Signal
Process Signal
Update Display
System Holdoff Time
Typical Capture Rate Range
1 - 100 Hz
 ART Cycle
Displayed Sweep
Sweep Holdoff Time
Maximum Capture Rate
7104 Analog scope 400k/sec
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1995 TDS784 InstaVu – The 1st Generation
 Benefits
 First scope to achieve the
bandwidth and waveform capture
rate of the world’s fastest analog
scope the 7104
 Shortcomings
 Max InstaVu sample rate 1GS/s E.T.
 Waveform image depth 1bit
 No gray scale, only persistence
 Measurement rate 30/sec
 Conventional measurement
made on a single waveform
 InstaVu records 500pts
 DSO records 0.5Mpts
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1995 InstaVu First Generation
Waveform Capture Rate
Analog Real-Time
Digital Storage
InstaVu
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The Challenges
 Dynamic-Complex Signals
May contain multiple modulation types including frequency,
phase, amplitude, and/or noise
Reside in new dense signal environments
May contain:
Complex modulated RF
Jitter
Glitches
Cross Talk
Contention
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1998 The Second Generation
A new oscilloscope technology
that stores, displays, and analyzes
dynamic-complex signals
in real time.
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1998 A Breakthrough Solution
The Digital Phosphor Oscilloscope
 Digital Phosphor Oscilloscope
An instrument that digitizes electrical signals and
displays, stores, and analyzes three dimensions of
signal information in real time.
Digital
Phosphor
DPO
Amp
A/D
Acquisition
Rasterizer
DPX
Waveform Imaging
Processor
Display
Memory
Display
uP
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Parallel
Processing
1998 Compare the Architectures
Delay
Line
ART
Vert
Amp
X
Amp
Analog
Display
Display
Trigger
Horiz
Sweep
Y
Z
DSO
Amp
A/D
DeMUX
Digital
Phosphor
DPO
Amp
A/D
Acquisition
Rasterizer
Acquisition
Memory
uP
Display
Serial
Processing
DPX
Waveform Imaging
Processor
Display
Memory
Display
uP
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Display
Memory
Parallel
Processing
1998 Tektronix TDS784D DPO,
Technology Enhanced by DPX™
 DPX is a Tektronix
proprietary waveform
imaging processor that
creates and manages the
real-time intensity grading
 Each channel has its own
DPX Waveform Imaging
Processor
 DPX is a 13 mm2 die using
0.65µ CMOS Technology and
1.3 million transistors
 DPX provides 24,000,000,000
read-modify-write operations
(RMW) per second
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1998 TDS784D DPO – The 2nd Generation
 Benefits
 2GHz bandwidth with 400,000
acquisitions/second
 Waveform image depth 22 bits
 Gray scale in DPO
 DPO record length up to 0.5Meg
 Z axis modulation
 Shortcomings
 Max DPO sample rate 1GS/s
 Measurement rate 30/sec
 Conventional measurement
made on a single waveform
 Min/max compression
 8Meg records required E.A.L mode
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DPO Is Not A Persistence Mode
Analog
DSO Persistence
DPO
 Persistence modes can create intensity grading in the display system by using
normally acquired waveforms and post processing
 Limited by the DSOs capture rate
 Lacks real time feedback
 May miss intermittent events
 Limited in actual distribution of events information
 DPOs provide intensity grading, in real-time, as part of the acquisition system
 Limited only by acquisition (trigger) rate
 Provides intensity graded display information on dynamic signals
 Captures dynamic signal variations, in real-time, enabling the user to see actual signal behavior
 Rapidly builds a statistical representation of actual signal behavior
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The Challenges
 Extend the ability to examine Dynamic complex
signals to the data rates and time windows required
for today’s computer and communications
 Measurement and test throughput
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Today: 3rd Generation DPX
 Digital Phosphor Oscilloscope
An instrument that digitizes electrical signals and
displays, stores, and analyzes three dimensions of
signal information in real time.
“Measurement throughput to match waveform throughput”
Digital
Phosphor
DPO
Amp
A/D
Acquisition
Rasterizer
Display
Display &
Measure
Memory
DSP &
Measure
Fast 64 bit Measurements with Statistics
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Windows
processor
Parallel
Processing
Today: TDS7000 3rd Generation DPX
 Benefits
 4GHz bandwidth with 400,000
acquisitions/second
 Waveform image depth 64 bits
 Gray scale record view
Amp
compression

View entire record
Digital
Phosphor
A/D
Acquisition
Rasterizer
 Fast Acq record length up to 1Meg
 WfmDB sample rate 20GS/s ET
 Real sample every 50ps after trigger
 Fast waveform data base
measurements
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DSP &
Measure
Display
Display &
Measure
Memory
Window’s
processor
Still the leader Waveform Capture Rate
Including Infiniium MegaZoom and WaveMaster Xstream
Waveform Capture Rate
(Waveforms/Second)
TDS7000 3rd gen DPX
>400,000 waveforms/Sec
1000000
100000
10000
TDS3000B with DPO
Acquisition >3500 Waveforms/Sec
1000
100
LeCroy WaveMaster 8600
with APO+Segmented Mem
1000 waveforms/Sec, best case
Xstream
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Infiniium 54855 6GHz
140 Waveforms/Sec
MegaZoom
1
0.1
5 ms/div
500 ps/div
Sweep Speed (Log Scale)
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LeCroy says in the press:
“LeCroy claims that WaveMaster, in
segmented memory mode, betters by
50% the 400,000 waveforms/sec of
Tektronix’s fastest DPO displays”
Source: Smart Scopes, EDN magazine,Dan Straussberg, March7, 2002
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Today: LeCroy with Xstream
Sequence Mode
60 sec @ 1us/div
Xstream is no
match for DPO
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Today Tektronix 3rd Gen DPX
FastAq Mode
60 sec @ 1us/div
DPO is hundreds
of times faster
than Xstream for
troubleshooting
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LeCroy fud in the press:
“2.5Gb/s eye diagram using LA
Techniques LA19-01-01 producing PRBS
data stream. LeCroy using SDM software
option in mask test mode.”
Throughput ratio: LeCroy/Tektronix=651
Source: Scopes trial, EDN magazine,Dan Straussberg, March 6, 2003
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Xstream Mask Testing – SDA6000
20GS/s dots
Mask testing
measurements
Clock recovery
Sequential
acquisition
1400 UI/min
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Xstream Mask Testing – SDA6000
Avoid
“traditional” it
is even slower
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3rd Gen DPX Mask Testing TDS7404
20GS/s dots
Mask testing
with
measurements
Clock recovery
Wfmdb acquisition
483,000
UI/minute
350X faster
than SDA
(4000X faster in fast acq at
1.25GS/s)
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Infiniium 54853, 54854 and 54855
 Waveform throughput limited to about 100/sec
 Poor choice for troubleshooting or analyzing complex
waveforms
 Midrange Infiniiums are faster than WaveMaster
 No support for serial data testing today. Agilent
certainly knows how to do this on DCA.
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Summary: InstaVu, DPO, 3rd Gen DPX
 Significant advances with each generation of fast
acquisition.
 Xstream or MegaZoom cannot match our waveform
throughput for troubleshooting or analyzing complex
waveforms.
 3rd generation DPX’s combination of 20GS/s
precision, fast throughput and 64 bit data base
measurements exceed SDA or Infiniium by a wide
margin.
 Hands on labs with the competitor’s products to see
for yourself.
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Knowledge Review
 3rd gen DPX’s Waveform Data Base is acquired at
1GS/s, 1.5GS/s, 20GS/s?
 Xstream is 100X, 1X, .003X faster than 3rd Gen DPX
for troubleshooting?
 SDA with Xstream is 100X, 1X, 0.003X faster for mask
and compliance tests on fast serial data?
 MegaZoom is more likely, about same, less likely to
be able to identify and measure distribution of
occurrence information?
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