Transcript EVSTF-08-05ex

Japan comment (Summary)
EVSTF-08-05e
Could you explain the reason why you changed from
current China-Japan draft modified at 6th TF meeting?
e.g.
1. Definition of “thermal runaway” was changed.
2. Overcharge was added as initiation method.
3. dT/dt was added as stop condition.
4. Observation time was deleted.
:
The initiation method should be selected by OEM, not by
supplier.
Japan comment (Summary)
For cells which internal short circuit never occur by
overcharge, OEM can select other methods, right?
For cells which thermal runaway caused by internal short
circuit never occur by all means, how about exempting this
test?
Since each cell has different structure and chemistry, it is
difficult to define the methods to detect internal short
circuit. (e.g. temperature rise, voltage drop and so on) So,
the occurrence of internal short circuit should be verified
by OEM.