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8th European Workshop on Microelectronics Education – EWME‘2010 Darmstadt, May 10-12, 2010 E-Learning Environment for WEB-Based Study of Testing R.Ubar1, A.Jutman1, J.Raik1, S.Kostin1, H.-D.Wuttke2 Department of Computer Engineering 1Dept. of Computer Engineering Tallinn University 2Dept. of Technology of Technical Informatics Estonia Tallinn University of Technology Technical University of Ilmenau Estonia Germany Motivation ITRS: semiconductor test is already one of key problems in current generation of VLSI chips and its importance will be growing There is a strong demand for well-educated specialists in the area of IC and microelectronics testing Interactive training tools as addendum to LMS are needed to facilitate teaching process TUT has a 15 years tradition in developing training tools in microelectronic testing Students develop the software themselves under supervision of graduate students and senior personnel EWME May 10–12, 2010 E-Learning Environment for WEB-Based Study of Testing 2 8th European Workshop on Microelectronics Education – EWME‘2010 Motivation Cutting Edge Research −Needs custom developed algorithms and/or tools PhD Students −Need to run their experiments Undergraduate Students −Need introduction to the topic Department −Needs training materials and research 3 8th European Workshop on Microelectronics Education – EWME‘2010 Outline Different layers of the platform HW tools PC-based tools Web interface E-Learning tools Conclusions and discussion 4 8th European Workshop on Microelectronics Education – EWME‘2010 Different layers of the platform Web Tools PC Tools Hardware Tools 5 8th European Workshop on Microelectronics Education – EWME‘2010 Main components of the platform DefSim - an integrated measurement environment for physical defect study in CMOS circuits. TurboTester – a research and training toolkit with extensive set of tools for digital test and design for testability Web-based runtime interface for remote access to our tools Java applets – illustrative e-learning software written specifically for the web Other tools 6 8th European Workshop on Microelectronics Education – EWME‘2010 Different layers of the platform Web Tools PC Tools Hardware Tools 7 8th European Workshop on Microelectronics Education – EWME‘2010 Defect Study using DefSim DefSim is an integrated circuit (ASIC) and a measurement equipmrnt for experimental study of CMOS defects. The central element of the DefSim equipment is an educational IC with a large variety of shorts and opens physically inserted into a set of simple digital circuits. The IC is attached to a dedicated measurement box serving as an interface to the computer. The box supports two measurement modes voltage and IDDQ testing. http://www.defsim.com 8 8th European Workshop on Microelectronics Education – EWME‘2010 DefSim IC details − Standard industrial CMOS technology − Area 19.90 mm2 − Approx. 48000 transistors − 62 pins − JLCC68 package A built-in current monitor for IDDQ testing is implemented in each block. 9 8th European Workshop on Microelectronics Education – EWME‘2010 Implementation of defects NAND2 cell with floating gate VDD Q A X B GND 10 8th European Workshop on Microelectronics Education – EWME‘2010 Implementation of defects NAND2 cell with D-S short (missing poly) VDD Q A • AltogetherBthere are over 500 different defects on the chip • Implemented defects are GND shorts and opens in metal and poly layers • To be close to the silicon reality each cell is loaded and driven by standard non-inverting buffers 11 8th European Workshop on Microelectronics Education – EWME‘2010 DefSim in the classroom With DefSim you can Observe the truth table of correct circuit Observe the truth table of defective circuit Obtain defect/fault tables for all specific defects Define test patterns automatically or manually Activate IDDQ and voltage measurements Study behavior of bridging and open faults Study and compare different fault models 12 8th European Workshop on Microelectronics Education – EWME‘2010 DefSim lab environment “Plug and Play” – dedicated hardware and software 13 8th European Workshop on Microelectronics Education – EWME‘2010 Different layers of the platform Web Tools PC Tools Hardware Tools 14 8th European Workshop on Microelectronics Education – EWME‘2010 PC-Based Toolkit – Turbo Tester Multivalued Simulator Specification Faulty Area Test Generators Design BIST Emulator Design Error Diagnosis http://www.pld.ttu.ee/tt Test Set Test Set Optimizer Hazard Analysis Data Logic Simulator Fault Simulator Defect Library Fault Table 15 Used in 100+ institutions in 40+ countries 8th European Workshop on Microelectronics Education – EWME‘2010 PC-Based Toolkit – Turbo Tester Formats: EDIF AGM Specification Faulty Area Levels: Gate Macro RTL Algorithms: Deterministic Random Genetic Circuits: Combinational Sequential Test Generators Design BIST Emulator Design Error Diagnosis Methods: BILBO CSTP Hybrid http://www.pld.ttu.ee/tt Test Set Test Set Optimizer Multivalued Simulator Hazard Analysis Data Logic Simulator Fault Simulator Fault Table Defect Library Fault models: Stuck-at faults Physical defects 16 Used in 100+ institutions in 40+ countries 8th European Workshop on Microelectronics Education – EWME‘2010 Turbo Tester: Basic Facts Freeware Downloadable via the Web Windows, Linux, UNIX/Solaris EDIF design interface ATPGs, BIST, simulators, test compaction Provides homogeneous environment for research and training 17 8th European Workshop on Microelectronics Education – EWME‘2010 Different layers of the platform Web Tools PC Tools Hardware Tools 18 8th European Workshop on Microelectronics Education – EWME‘2010 BIST Analyzer: covered topics Test Pattern Generators (PRPG): − LFSR − Modular LFSR − Cellular Automata − GLFSR − Weighted TPG − etc. Combined Techniques (PRPG + Memory): − Reseeding − Multiple polynomial BIST − Hybrid BIST − Bit-Flipping BIST − Column matching BIST − etc. Typical BIST Architecture Test Pattern Generator (PRPG) BIST Control Unit Circuit Under Test (CUT) BIST Memory ........ ........ Output Response Analyzer (MISR) 19 8th European Workshop on Microelectronics Education – EWME‘2010 BIST Analyzer: covered topics •Embedded generators (PRPG) and their properties •PRPG optimization methodologies and algorithms •Combined BIST solutions (PRPG+memory) •Fault detection and diagnosis in BIST 20 8th European Workshop on Microelectronics Education – EWME‘2010 BIST Analyzer 21 8th European Workshop on Microelectronics Education – EWME‘2010 Different layers of the platform Web Tools PC Tools Hardware Tools 23 8th European Workshop on Microelectronics Education – EWME‘2010 Web Interface 24 8th European Workshop on Microelectronics Education – EWME‘2010 Different layers of the platform Web Tools PC Tools Hardware Tools 25 8th European Workshop on Microelectronics Education – EWME‘2010 E-Learning software on DFT http://www.pld.ttu.ee/applets 26 8th European Workshop on Microelectronics Education – EWME‘2010 Benefits of e-learning software Essential supplement to the university lectures Accessibility over Internet Visual content (“Living Pictures”) Comprehensive examples Better organization of teaching materials Based on free educational software Distance learning & computer aided teaching Easy to implement in other universities Constantly updated 27 8th European Workshop on Microelectronics Education – EWME‘2010 Turbo Tester Java Applets E-Learning Software Web based tools for classroom, home and exams Tools for laboratory research Scenario 12 Learning Scenario Scenario 34 Test Scenario Error Scenarios Built-Infor Generation Design Diagnosis Self-Test Testability Test Generation Scenario 12 Supporting Scenario Scenario 34 Scenario Test Error Materials Built-Infor Generation Design Design for Testability Turbo Tester Diagnosis Self-Test Testability Test and Diagnostics RTL Design and Test Boundary Scan Error Diagnosis Built-In Self-Test Applet on Basics of Test & Diagnostics Schematic & DD Editor Applet on RTL Design and Test Applet on Boundary Scan Standard Group of Applets on Control Part Decomposition 28 8th European Workshop on Microelectronics Education – EWME‘2010 E-Learning Software Software for classroom, home, labs and exams: Logic level diagnostics System level test & DfT Boundary Scan http://www.pld.ttu.ee/applets 29 8th European Workshop on Microelectronics Education – EWME‘2010 Applet on basics of test • • • • • manual test pattern generation assisted by the applet generation of pseudo-random test vectors by LFSR fault simulation & study of fault table combinational fault diagnosis using fault tables sequential fault diagnosis by guided probing 30 8th European Workshop on Microelectronics Education – EWME‘2010 Applet on RT-level design and test • • • • • • • design of a data path and control path (microprogram) on RT level investigation of tradeoffs between speed of the system & HW cost RT-level simulation and validation gate-level deterministic test generation and functional testing fault simulation logic and circular BIST, functional BIST, etc. design for testability 31 8th European Workshop on Microelectronics Education – EWME‘2010 Applet on Boundary Scan • • • • • Simulation of operation of TAP Controller Illustration of work of BS registers Insertion and diagnosis of interconnection faults Design/editing of BS structures using the BSDL language Design/description of the target board using several chips 32 8th European Workshop on Microelectronics Education – EWME‘2010 Schematic and DD editor Design for Main functions of the applet are: Testability • gate-level schematic editor • SSBDD editor • schematic ↔ SSBDD on-the-fly converter AGM, • different format reader/converter GIF Applet on Basics of Test & Diagnostics AGM, DWG Schematic & DD Editor AGM, GIF Applet on RTL Design and Test An applet targeted at binding all the applets and the Turbo Tester AGM Applet on Boundary Scan Standard Supported interface formats are: AGM DWG VHDL GIF EDIF? PostScript? 33 8th European Workshop on Microelectronics Education – EWME‘2010 Example of a lab work scenario XTimport Tool Circuit Netlist Report File Design Specification ATPG Design Implementation Test Vector File Prediag Tool Verification Results Intermediate Diagnosis Verification Tool Human Being Diagnostic Vectors Turbo Tester tools and formats Other Circuit Schematic Final Diagnosis Test Vector File Vecmanager Tool 34 8th European Workshop on Microelectronics Education – EWME‘2010 Conclusions The main features of the platform: •Research engine + training software •Layered structure •HW and SW components •Remote access •Distance learning and e-learning •Computer-aided teaching •Freeware 35 8th European Workshop on Microelectronics Education – EWME‘2010 Conclusions 36 8th European Workshop on Microelectronics Education – EWME‘2010 Our Tools on the Web The Turbo Tester home page http://www.pld.ttu.ee/tt/ The Turbo Tester web-server page http://www.pld.ttu.ee/webtt/ DefSim home page http://www.defsim.com Java applets home page http://www.pld.ttu.ee/applets/ 37