Ramon Chips RadSafe and J2K

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Transcript Ramon Chips RadSafe and J2K

Ramon Chips
Ramon Chips is named in
memory of Col. Ilan Ramon,
Israeli astronaut who died
on board the Columbia
space shuttle, 1/2/2003
Rad-Tolerant design of all-digital DLL
Tuvia Liran [[email protected] ]
Ran Ginosar [[email protected] ]
Dov Alon [[email protected] ]
Ramon-Chips Ltd., Israel
Ramon Chips
Outline
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Issues with analog DLL/PLL
All-digital DLL (ADDLL) architecture
Radiation hardening of ADDLL
Applications of ADDLL
Integration of ADDLL in SOC
Future developments
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Issues with analog PLL
frequency
Ionizing particle
clk_ref
PFD
+
CP
VCO
clk_out
control voltage
control
voltage
/N
Issues:
- Sensitive to TID of analog
- Might un-lock due to SET
- Accumulate phase error due to SET
- Might miss cycle due to SET
- Sensitive to process, voltage,
temperature
Discharge by
ionizing particle
time
frequency
time
phase
Missing clock cycle
time
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All-digital DLL concept
• Standard cell based logic
 Operates at wide range of process, voltage & temperature
• Timing is controlled by logic
• Fast locking / immediate re-locking
• Low jitter – typically <1% of CLKREF period
DCDL
MUL
CLK1X
CLK2X
CLK4X
ctrl[m-1:0]
REFCLK
PHD
up
dn
CTRL
clkfb
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DCDL operation
IN
EN0
EN1
EN2
OUT
Gross tuning of delay
Fine tuning of delay
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DCDL response to control code
DCDL4 Delay vs code
1.40E-08
1.20E-08
1.00E-08
Delay
8.00E-09
6.00E-09
4.00E-09
2.00E-09
0.00E+00
0
50
100
150
200
250
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350
400
450
Code
slow
typ
fast
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up_slow
up_fast
dn_slow
dn_fast
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Radiation hardening of ADDLL
• Key radiation hazards:
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TID
SEL
Phase error due to SE
Clock spike due to SET
Reset/re-configure due to SEU/SET
• RH mitigation techniques
• The use of RadSafeTM std. cells – immunity to TID & SEL
• Use of SEP flip-flops mitigates SEU – immunity to change
in control
• Glitch filtering at each DCDL stage – mitigates SET spikes
• Requirements for double sampling of reset – mitigates
SET in reset/load
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Advantages of ADDLL
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Voltage range – as logic core
Temperature range – as logic core
Lock time – limited # of cycles
Re-locking time – immediate
Standby power – zero
Dynamic power – very low
Bursts of clocks - enabled
Control of slave delay lines - enabled
Area – very small
Floor planning – anywhere in the chip / I/O
strip
• Immunity to Soft-Errors - Optional
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ADDLL in RadSafeTM library
CTRLEN
FBCLK
PHDREF
PHD
Phase
detector
BCNT[11:0]
CTRL_IN[11:0]
LDEN
DLCTR
Delay controller
LDB
CLKOUT
REFCLK
DCDL
Digitally Controlled Delay
Line
PH[8:1]
CLK1X
CLK2X
CLK4X
DCDLEN
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FCLKEN
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All-digital DLL cores
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Three DLL cores for 3 frequency ranges
Locking guaranteed
0.05 mm2/core
8 mW/core @0.18u
Highly protected from radiation effects
Can be placed anywhere in the core
Powered by core supply lines
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ADDLL application – de-skewing
FBCLK
CLKOUT
PHDREF
REFCLK
CLK
Tree
ADDLL
DCDLREF
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ADDLL application –
frequency multiplication
REFCLK
PHOUT[0]
PHOUT[1]
PHOUT[2]
PHOUT[3]
PHOUT[4]
PHOUT[5]
PHOUT[6]
PHOUT[7]
CLK2X
CLK4X
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ADDLL application –
master-slave operation
LOCK
CTRLSL CTRL_OUT
CTRL_IN
FBCLK
LOCK
CTRLSL CTRL_OUT
FBCLK
CLKOUT
PHDREF
REFCLK
CTRL_IN
RSTB
PHDREF
ADDLL
PHOUT[n-1:0]
DCDLREF
CTRLEN
DCDLEN
PHOUT[n-1:0]
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CLKOUT
ADDLL
PHOUT[n-1:0]
DCDLREF
RSTB
CTRLEN
DCDLEN
PHOUT[2n-1:n]
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Other optional applications
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Frequency multiplication by 8X/16X…
Frequency multiplication by non 2n
Duty cycle re-construction
Digitally monitoring of aging/PVT
Operation with bursts of clocks
Frequency hoping
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Record of integrating ADDLLs
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Example of ADDLL
(commercial IP)
Slave DCDL
PHD
80µ
Slave
CTRL
SYNC
Dig
I/F
DCDL
140µ
•TSMC/0.13u process
•200-500MHz input clock
•Area: 0.01mm2
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CTRL
•Power: 2mW @1.2V
•Located inside I/O ring
•DDR2 application
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Summary
• ADDLL provides significant advantages over analog
PLL/DLLs
• RH ADDLL overcomes the sensitivities of analog
PLLs/DLLs
• ADDLL can be used for clock de-skewing and
multiplication, and other applications
• RadSafeTM ADDLL is mature and proven
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